Velocity dependent friction laws in contact mode atomic force microscopy.
Friction forces in the tip-sample contact govern the dynamics of contact mode atomic force microscopy. In ambient conditions typical contact radii between tip and sample are in the order of a few nanometers. In order to account for the large interaction area the dynamics of contact mode atomic force microscope (AFM) is investigated under the assumption of a multi-asperity contact interface between tip and sample. Thus, the kinetic friction force between tip and sample is the product of the real contact area between both solids and the interfacial shear strength. The velocity strengthening of the lateral force is modeled assuming a logarithmic relationship between shear-strength and velocity. Numerical simulations of the system dynamics with this empirical model show the existence of two different regimes in contact mode AFM: steady sliding and stick-slip where the tip undergoes periodically stiction and kinetic friction. The state of the system depends on the scan velocity as well as on the velocity dependence of the interfacial friction force between tip and sample. Already small viscous damping contributions in the tip-sample contact are sufficient to suppress stick-slip oscillations.
Stark
Robert W
RW
Nanotechnology Group, Swiss Federal Institute of Technology Zurich, ETH Zentrum/CLA, CH-8092 Zurich, Switzerland. stark@nanomanipulation.de
Schitter
Georg
G
Stemmer
Andreas
A