title: Identification of the first nucleated phase in submonolayer Ti deposited on Si(111)-7 x 7 by atomic resolution techniques.
abstract: Ti5Si4 has been identified to be the first nucleated phase in submonolayer Ti deposited on the Si(111)-7 x 7 surface by ultrahigh vacuum scanning tunneling microscopy in conjunction with atomic-resolution transmission electron microscopy. The direct observation of the formation of clusters surrounded by the heavily damaged silicon lattice strongly suggested that Si is the dominant diffusing species in forming the silicide.
authors.affiliation: Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, People's Republic of China.
authors.forename: H F
authors.initials: HF
authors.lastname: Hsu
authors.forename: H C
authors.initials: HC
authors.lastname: Hsu
authors.forename: T F
authors.initials: TF
authors.lastname: Chiang
authors.forename: L J
authors.initials: LJ
authors.lastname: Chen
authors.forename: H L
authors.initials: HL
authors.lastname: Hsiao