An apparatus for temperature-dependent soft X-ray resonant magnetic scattering.
Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.
Jaouen
Nicolas
N
Laboratoire de Cristallographie, CNRS, BP 16, 25 Avenue des Martyrs, 38042 Grenoble, France. jaouen@esrf.fr
Tonnerre
Jean Marc
JM
Kapoujian
Grigor
G
Taunier
Pierre
P
Roux
Jean-Paul
JP
Raoux
Denis
D
Sirotti
Fausto
F