title: An apparatus for temperature-dependent soft X-ray resonant magnetic scattering.
abstract: Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.
authors.affiliation: Laboratoire de Cristallographie, CNRS, BP 16, 25 Avenue des Martyrs, 38042 Grenoble, France. jaouen@esrf.fr
authors.forename: Nicolas
authors.initials: N
authors.lastname: Jaouen
authors.forename: Jean Marc
authors.initials: JM
authors.lastname: Tonnerre
authors.forename: Grigor
authors.initials: G
authors.lastname: Kapoujian
authors.forename: Pierre
authors.initials: P
authors.lastname: Taunier
authors.forename: Jean-Paul
authors.initials: JP
authors.lastname: Roux
authors.forename: Denis
authors.initials: D
authors.lastname: Raoux
authors.forename: Fausto
authors.initials: F
authors.lastname: Sirotti