title: Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source.
abstract: The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.
authors.affiliation: Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA.
authors.forename: T
authors.initials: T
authors.lastname: Warwick
authors.forename: H
authors.initials: H
authors.lastname: Ade
authors.forename: S
authors.initials: S
authors.lastname: Cerasari
authors.forename: J
authors.initials: J
authors.lastname: Denlinger
authors.forename: K
authors.initials: K
authors.lastname: Franck
authors.forename: A
authors.initials: A
authors.lastname: Garcia
authors.forename: S
authors.initials: S
authors.lastname: Hayakawa
authors.forename: A
authors.initials: A
authors.lastname: Hitchcock
authors.forename: J
authors.initials: J
authors.lastname: Kikuma
authors.forename: S
authors.initials: S
authors.lastname: Klingler
authors.forename: J
authors.initials: J
authors.lastname: Kortright
authors.forename: G
authors.initials: G
authors.lastname: Morisson
authors.forename: M
authors.initials: M
authors.lastname: Moronne
authors.forename: E
authors.initials: E
authors.lastname: Rightor
authors.forename: E
authors.initials: E
authors.lastname: Rotenberg
authors.forename: S
authors.initials: S
authors.lastname: Seal
authors.forename: H J
authors.initials: HJ
authors.lastname: Shin
authors.forename: W F
authors.initials: WF
authors.lastname: Steele
authors.forename: B P
authors.initials: BP
authors.lastname: Tonner