A simple accurate method of alignment of beamline optics with the use of EUV multilayer polarizers.
A simple alignment method is proposed, which enables the alignment of beamline optics of a bending section accurately, relying on the linear state of polarization of synchrotron orbital radiation rather than the beam intensity. The method utilizes extreme UV (EUV) multilayers as a compact polarization monitor detecting unwanted vertical polarization components. The proposed method was found to be far more sensitive than that relying on the maximum intensity. Another advantage is the insensitivity to surface contamination, such as an irradiation mark on the mirror degrading reflectance. A design example is presented for use around a photon energy of 370 eV along with an experimental example at a photon energy of 97 eV.
Yamamoto
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M
Laboratory of Soft X-ray Multilayers, Research Institute of Scientific Measurements, Tohoku University, Katahira, Sendai 980-77, Japan.
Furudate
M
M
Yanagihara
M
M
Kimura
H
H