title: Spectrometer for polarized soft X-ray Raman scattering.
abstract: An experimental system for polarized soft X-ray Raman scattering spectroscopy has been constructed. The soft X-ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a ray-trace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 micro m slit width. The polarized and depolarized soft X-ray Raman scattering spectra can be measured by rotating the soft X-ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL-2C of the Photon Factory.
authors.affiliation: Synchrotron Radiation Laboratory, Institute for Solid State Physics, University of Tokyo, Tanashi, Tokyo 188, Japan.
authors.forename: Y
authors.initials: Y
authors.lastname: Harada
authors.forename: H
authors.initials: H
authors.lastname: Ishii
authors.forename: M
authors.initials: M
authors.lastname: Fujisawa
authors.forename: Y
authors.initials: Y
authors.lastname: Tezuka
authors.forename: S
authors.initials: S
authors.lastname: Shin
authors.forename: M
authors.initials: M
authors.lastname: Watanabe
authors.forename: Y
authors.initials: Y
authors.lastname: Kitajima
authors.forename: A
authors.initials: A
authors.lastname: Yagishita