title: Focusing Optics for High-Energy X-ray Diffraction.
abstract: Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40-100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 micro m-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techniques based on conventional X-ray sources, neutron scattering or electron microscopy.
authors.affiliation: ESRF, BP 220, F-38043 Grenoble CEDEX, France, and Risø National Laboratory, Materials Department, DK-4000 Roskilde, Denmark.
authors.forename: U
authors.initials: U
authors.lastname: Lienert
authors.forename: C
authors.initials: C
authors.lastname: Schulze
authors.forename: V
authors.initials: V
authors.lastname: Honkimäki
authors.forename: T
authors.initials: T
authors.lastname: Tschentscher
authors.forename: S
authors.initials: S
authors.lastname: Garbe
authors.forename: O
authors.initials: O
authors.lastname: Hignette
authors.forename: A
authors.initials: A
authors.lastname: Horsewell
authors.forename: M
authors.initials: M
authors.lastname: Lingham
authors.forename: H F
authors.initials: HF
authors.lastname: Poulsen
authors.forename: N B
authors.initials: NB
authors.lastname: Thomsen
authors.forename: E
authors.initials: E
authors.lastname: Ziegler