title: Shot noise in linear macroscopic resistors.
abstract: We report on direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. The present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.
authors.affiliation: Department d'Electronica and Research Centre for Bioelectronics and Nanobioscience, Universitat de Barcelona, Edifici Modulari, Josep Samitier 1-5, 08028 Barcelona, Spain.
authors.forename: G
authors.initials: G
authors.lastname: Gomila
authors.forename: C
authors.initials: C
authors.lastname: Pennetta
authors.forename: L
authors.initials: L
authors.lastname: Reggiani
authors.forename: M
authors.initials: M
authors.lastname: Sampietro
authors.forename: G
authors.initials: G
authors.lastname: Ferrari
authors.forename: G
authors.initials: G
authors.lastname: Bertuccio