title: Observation of composition in surface monolayers by X-ray scattering spectra caused by crystal truncation and interferences.
abstract: X-ray crystal-truncation-rod (CTR) scattering measurements using synchrotron radiation and an imaging plate can reveal the composition of a surface monolayer. Even when the composition is changed in only one atomic layer on the top surface, the X-ray CTR spectrum can change due to the differences in composition. X-ray CTR spectra are greatly enhanced by X-ray interference when a sample is designed properly. In this paper, it is shown by theoretical calculations and experiments for AlAs/GaAs samples grown by MBE that a 1 ML (monolayer)-thick AlAs layer embedded under 10 ML below the surface can enhance the modulation of an X-ray CTR spectrum.
authors.affiliation: Department of Materials Science and Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-01, Japan.
authors.forename: M
authors.initials: M
authors.lastname: Tabuchi
authors.forename: M
authors.initials: M
authors.lastname: Yokoi
authors.forename: S
authors.initials: S
authors.lastname: Ichiki
authors.forename: K
authors.initials: K
authors.lastname: Fujita
authors.forename: Y
authors.initials: Y
authors.lastname: Takeda