title: Synchrotron X-ray and ab initio studies of beta-Si3N4.
abstract: Almost absorption- and extinction-free single-crystal synchrotron X-ray diffraction data were measured at 150, 200 and 295 K for beta-Si3N4, silicon nitride, at a wavelength of 0.7 A. The true symmetry of this material has been the subject of minor controversy for several decades. No compelling evidence favouring the low-symmetry P6(3) model was identified in this study.
authors.affiliation: Ceramics Research Laboratory, Nagoya Institute of Technology, Asahigaoka, Tajimi 507-0071, Japan.
authors.forename: D
authors.initials: D
authors.lastname: du Boulay
authors.forename: N
authors.initials: N
authors.lastname: Ishizawa
authors.forename: T
authors.initials: T
authors.lastname: Atake
authors.forename: V
authors.initials: V
authors.lastname: Streltsov
authors.forename: K
authors.initials: K
authors.lastname: Furuya
authors.forename: F
authors.initials: F
authors.lastname: Munakata