The use of amorphous silicon flat panels as detector in neutron imaging.
A first test for neutron detection with a flat panel device based on the amorphous silicon technology is described in this report. The most important parameters defining the performance for neutron imaging are described. The first findings are encouraging for further improvements.
Lehmann
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Paul Scherrer Institute, WHGA/349, Villigen PSI CH-5232, Switzerland. eberhard.lehmann@psi.ch
Vontobel
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