title: X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU.
abstract: An X-ray microprobe system for X-ray fluorescence (XRF) analysis and spectroscopy has been developed at SPring-8 BL39XU; it comprises an X-ray focusing or collimation system, energy-dispersive (ED) and wavelength-dispersive (WD) XRF spectrometers, and a sample-scanning system. The conventional ED spectrometer will be utilized for qualitative and quantitative trace-element analysis, and the WD spectrometer will be used both for trace-element analysis and XRF spectroscopy. A combination of monochromated undulator radiation and the WD spectrometer will enable resonant XRF spectroscopy using brilliant hard X-ray undulator radiation.
authors.affiliation: Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Hayakawa
authors.forename: S
authors.initials: S
authors.lastname: Goto
authors.forename: T
authors.initials: T
authors.lastname: Shoji
authors.forename: E
authors.initials: E
authors.lastname: Yamada
authors.forename: Y
authors.initials: Y
authors.lastname: Gohshi