title: X-ray diffraction with a Bragg angle near pi/2 and its applications.
abstract: X-ray dynamical diffraction phenomena at a Bragg angle near pi/2 are studied. The X-ray transmissivity as well as the reflectivity from the (991) lattice plane of a silicon thin plate is observed. It agrees fairly well with the diffraction pattern calculated on the basis of the Darwin approach. The possibility is discussed whether a set of two crystal plates arranged face to face, in which the diffraction condition with a Bragg angle near pi/2 is satisfied, may be used as a very high resolution monochromator.
authors.affiliation: Department of Applied Physics, School of Engineering, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Kikuta
authors.forename: Y
authors.initials: Y
authors.lastname: Imai
authors.forename: T
authors.initials: T
authors.lastname: Iizuka
authors.forename: Y
authors.initials: Y
authors.lastname: Yoda
authors.forename: X W
authors.initials: XW
authors.lastname: Zhang
authors.forename: K
authors.initials: K
authors.lastname: Hirano