Material analysis end-station of the Hyogo-ken beamline at SPring-8.
Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction. X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.
Kaneyoshi
T
T
Hyogo Prefectural Institute of Industrial Research, Kobe 654, Japan.
Ishihara
T
T
Yoshioka
H
H
Motoyama
M
M
Fukushima
S
S
Hayashi
K
K
Kawai
J
J
Taniguchi
K
K
Hayakawa
S
S
Gohshi
Y
Y