title: AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects.
abstract: An alpha,alpha-dimethyl-3,5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios.
authors.affiliation: Department of Chemistry, University of California Berkeley, Berkeley, California, 94720-1460, USA.
authors.forename: Zachary M
authors.initials: ZM
authors.lastname: Fresco
authors.forename: Itai
authors.initials: I
authors.lastname: Suez
authors.forename: Scott A
authors.initials: SA
authors.lastname: Backer
authors.forename: Jean M J
authors.initials: JM
authors.lastname: Fréchet