X-ray topography of tetragonal lysozyme grown by the temperature-controlled technique.
Growth-induced defects in lysozyme crystals were observed by white-beam and monochromatic X-ray topography at the National Synchrotron Light Source (NSLS) at the Brookhaven National Laboratory (BNL). The topographic methods were non-destructive to the extent that traditional diffraction data collection could be performed to high resolution after topography. It was found that changes in growth parameters, defect concentration as detected by X-ray topography, and the diffraction quality obtainable from the crystals were all strongly correlated. In addition, crystals with fewer defects showed lower mosaicity and higher diffraction resolution as expected.
Stojanoff
V
V
NSLS, Brookhaven National Laboratory, Upton, NY 11973, USA.
Siddons
D P
DP
Monaco
L A
LA
Vekilov
P
P
Rosenberger
F
F