X-ray topography of tetragonal lysozyme grown by the temperature-controlled technique.
Growth-induced defects in lysozyme crystals were observed by white-beam and monochromatic X-ray topography at the National Synchrotron Light Source (NSLS) at the Brookhaven National Laboratory (BNL). The topographic methods were non-destructive to the extent that traditional diffraction data collection could be performed to high resolution after topography. It was found that changes in growth parameters, defect concentration as detected by X-ray topography, and the diffraction quality obtainable from the crystals were all strongly correlated. In addition, crystals with fewer defects showed lower mosaicity and higher diffraction resolution as expected.
NSLS, Brookhaven National Laboratory, Upton, NY 11973, USA.
V
V
Stojanoff
D P
DP
Siddons
L A
LA
Monaco
P
P
Vekilov
F
F
Rosenberger