Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy.
Morphologic characterization of polymers by scanning electron microscopy (SEM) is often made difficult by their sensitivity to electron beam damage. We describe here a specimen preparation method for the imaging of polymer blends by low-voltage SEM (LV-SEM) that improves their stability in the electron beam and hence facilitates focusing and recording of high magnification images. Its application to nanosized core-shell latexes embedded in a polymethylmethacrylate matrix and semi-crystalline polypropylene/ethylene-propylene rubber blends is discussed.
Centre Interdisciplinaire de Microscopie Electronique, Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland. cedric.gaillard@epfl.ch
Cedric
C
Gaillard
Pierre A
PA
Stadelmann
Christopher J G
CJ
Plummer
Gilbert
G
Fuchs