title: The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination.
abstract: A method of higher-order Laue zone line position measurement in convergent-beam electron diffraction (CBED) is proposed based on Hough transformation. A thorough analysis of the errors introduced by this measurement procedure is performed and their influence on the accuracy of lattice parameter determination is estimated. A criterion is derived which enables the accuracy to be predicted before experimental measurements are made and, thus, allows the selection of the best CBED geometry for parameter measurement.
authors.affiliation: Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. A.Chuvilin@microscopist.ru
authors.forename: Andrey
authors.initials: A
authors.lastname: Chuvilin
authors.forename: Thomas
authors.initials: T
authors.lastname: Kups
authors.forename: Ute
authors.initials: U
authors.lastname: Kaiser
mesh_terms: D000465:Algorithms; D003461:Crystallography; D007091:Image Processing, Computer-Assisted; D008855:Microscopy, Electron, Scanning / Q000379:methods*