title: Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers.
abstract: An optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers was designed for three-dimensional deformation measuring by electronic speckle pattern interferometry. Divergent illumination is considered in the evaluation of sensitivity vectors to measure both in-plane and out-of-plane displacement components. The combination of these interferometers presents the advantage of greater sensitivity in directions u, v, and w than a typical interferometer with three illumination beams provides. The system and its basic operation are described, and results with an elastic target that is exposed to a mechanical load are reported.
authors.affiliation: Centro de Investigaciones en Optica, A C, Apartado Postal 1-948, C P 37000, León, Guanajuato, Mexico. amalia@cio.mx
authors.forename: Amalia
authors.initials: A
authors.lastname: Martínez
authors.forename: Juan A
authors.initials: JA
authors.lastname: Rayas
authors.forename: Ramón
authors.initials: R
authors.lastname: Rodríguez-Vera
authors.forename: Héctor J
authors.initials: HJ
authors.lastname: Puga