Chemical junction delineation of a specific site in Si devices.
Eo
Hee-Joo
HJ
Yang
Jun-Mo
JM
Park
Tae-Su
TS
Lee
Jong-Pill
JP
Kim
Won
W
Park
Ju-Chul
JC
Lee
Soun-Young
SY
D003461:Crystallography; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D013499:Surface Properties
D012825:Silicon