title: [Use of cluster analysis for the study of self-stigmatization phenomenon].
abstract: Cluster analysis was used in the study of self-stigmatization phenomenon measured with the original self-stigmatization questionnaire in 81 patients with schizophrenia, affective and neurotic disorders. The answers presented by digital codes were analyzed statistically. Six factors of self-stigmatization were as follows: "a victim of stigma", "deidentification from the healthy", "predisposition to identification with mentally ill", "avoidance of mentally ill", "excuse by mental illness" and "generalization of stigma".
authors.forename: I I
authors.initials: II
authors.lastname: Mikhaĭlova
authors.forename: S A
authors.initials: SA
authors.lastname: Sudakov
authors.forename: S N
authors.initials: SN
authors.lastname: Enikolopov
authors.forename: S N
authors.initials: SN
authors.lastname: Miasoedov
mesh_terms: D000328:Adult; D016000:Cluster Analysis; D006801:Humans; D001523:Mental Disorders / Q000523:psychology*; D019964:Mood Disorders / Q000523:psychology; D009497:Neurotic Disorders / Q000523:psychology; D012565:Schizophrenic Psychology; D012649:Self Concept; D013240:Stereotyping