The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination.
A method of higher-order Laue zone line position measurement in convergent-beam electron diffraction (CBED) is proposed based on Hough transformation. A thorough analysis of the errors introduced by this measurement procedure is performed and their influence on the accuracy of lattice parameter determination is estimated. A criterion is derived which enables the accuracy to be predicted before experimental measurements are made and, thus, allows the selection of the best CBED geometry for parameter measurement.
Chuvilin
Andrey
A
Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. A.Chuvilin@microscopist.ru
Kups
Thomas
T
Kaiser
Ute
U
D000465:Algorithms; D003461:Crystallography; D007091:Image Processing, Computer-Assisted; D008855:Microscopy, Electron, Scanning / Q000379:methods*