title: Chemical junction delineation of a specific site in Si devices.
authors.forename: Hee-Joo
authors.initials: HJ
authors.lastname: Eo
authors.forename: Jun-Mo
authors.initials: JM
authors.lastname: Yang
authors.forename: Tae-Su
authors.initials: TS
authors.lastname: Park
authors.forename: Jong-Pill
authors.initials: JP
authors.lastname: Lee
authors.forename: Won
authors.initials: W
authors.lastname: Kim
authors.forename: Ju-Chul
authors.initials: JC
authors.lastname: Park
authors.forename: Soun-Young
authors.initials: SY
authors.lastname: Lee
mesh_terms: D003461:Crystallography; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D013499:Surface Properties
chemical_list: D012825:Silicon