title: Validation of the Korean version of the Syndrom Kurztest (SKT): a short test for the assessment of memory and attention.
abstract: The Syndrom Kurztest SKT is a brief neuropsychological test battery that consists of nine subtests and defines two independent factors of memory and attention deficit. The aim of this study was to validate the Korean version of the SKT. The reliability of each subtest among three parallel Forms (A, B and C) of the Korean version was high (r = 0.46-0.95). The SKT had good concurrent validity with the Mini-Mental State Examination (r = -0.83, p < 0.001). Factor analysis confirmed the presence of two primary factors, memory and attention. The overall similarities of the factor structures for the Korean data and those for the data from Germany and the USA provide evidence of the transcultural stability of the SKT.
authors.affiliation: Department of Neurology, College of Medicine, Inha University, Incheon, Korea.
authors.forename: Seong Hye
authors.initials: SH
authors.lastname: Choi
authors.forename: Byung Hwa
authors.initials: BH
authors.lastname: Lee
authors.forename: Dong Seok
authors.initials: DS
authors.lastname: Hahm
authors.forename: Jee Hyang
authors.initials: JH
authors.lastname: Jeong
authors.forename: Choong Kun
authors.initials: CK
authors.lastname: Ha
authors.forename: Seol-Heui
authors.initials: SH
authors.lastname: Han
authors.forename: Hellmut
authors.initials: H
authors.lastname: Erzigkeit
authors.forename: Duk L
authors.initials: DL
authors.lastname: Na
mesh_terms: D000368:Aged; D000369:Aged, 80 and over; D001288:Attention; D005260:Female; D006801:Humans; D008297:Male; D008568:Memory; D008875:Middle Aged; D009483:Neuropsychological Tests