title: Thermal AFM: a thermopile case study.
authors.affiliation: Centro Nacional de Microelectrónica (IMB-CSIC) Campus Universidad Autonoma de Barcelona, 08193 Bellaterra, Spain. luis.fonseca@cnm.es
authors.forename: L
authors.initials: L
authors.lastname: Fonseca
authors.forename: F
authors.initials: F
authors.lastname: Pérez-Murano
authors.forename: C
authors.initials: C
authors.lastname: Calaza
authors.forename: R
authors.initials: R
authors.lastname: Rubio
authors.forename: J
authors.initials: J
authors.lastname: Santander
authors.forename: E
authors.initials: E
authors.lastname: Figueras
authors.forename: I
authors.initials: I
authors.lastname: Gràcia
authors.forename: C
authors.initials: C
authors.lastname: Cané
authors.forename: M
authors.initials: M
authors.lastname: Moreno
authors.forename: S
authors.initials: S
authors.lastname: Marco
mesh_terms: D003952:Diagnostic Imaging / Q000295:instrumentation* / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D010069:Oxadiazoles; D012666:Semiconductors; D013696:Temperature
chemical_list: D010069:Oxadiazoles; C004184:methazole