Surface charge compensation for a highly charged ion emission microscope.
McDonald
J W
JW
Lawrence Livermore National Laboratory, L 472, Livermore, California 94550, USA. mcdonald6@llnl.gov
Hamza
A V
AV
Newman
M W
MW
Holder
J P
JP
Schneider
D H G
DH
Schenkel
T
T
D007477:Ions / Q000737:chemistry*; D008854:Microscopy, Electron / Q000379:methods; D012666:Semiconductors; D013057:Spectrum Analysis / Q000379:methods; D013499:Surface Properties
D007477:Ions