title: Structural analysis of the SiO2/Si100 interface by means of photoelectron diffraction.
authors.affiliation: Universität Dortmund, Lehrstuhl für Experimentelle Physik I, Otto-Hahn-Strasse 4, 44221 Dortmund, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Dreiner
authors.forename: M
authors.initials: M
authors.lastname: Schürmann
authors.forename: C
authors.initials: C
authors.lastname: Westphal