title: Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles.
authors.affiliation: FOM Institute for Plasma Physics Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands.
authors.forename: G
authors.initials: G
authors.lastname: Berden
authors.forename: S P
authors.initials: SP
authors.lastname: Jamison
authors.forename: A M
authors.initials: AM
authors.lastname: MacLeod
authors.forename: W A
authors.initials: WA
authors.lastname: Gillespie
authors.forename: B
authors.initials: B
authors.lastname: Redlich
authors.forename: A F G
authors.initials: AF
authors.lastname: van der Meer