title: Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina.
authors.affiliation: State Key Laboratory of Modern Optical Instruments, Zhejiang University, Hangzhou 310027, People's Republic of China. zhangdx@zju.edu.cn
authors.forename: Dongxian
authors.initials: D
authors.lastname: Zhang
authors.forename: Haijun
authors.initials: H
authors.lastname: Zhang
authors.forename: Xiaofeng
authors.initials: X
authors.lastname: Lin
mesh_terms: D000537:Aluminum Oxide / Q000737:chemistry*; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D036103:Nanotechnology
chemical_list: D000537:Aluminum Oxide