title: Surface charge compensation for a highly charged ion emission microscope.
authors.affiliation: Lawrence Livermore National Laboratory, L 472, Livermore, California 94550, USA. mcdonald6@llnl.gov
authors.forename: J W
authors.initials: JW
authors.lastname: McDonald
authors.forename: A V
authors.initials: AV
authors.lastname: Hamza
authors.forename: M W
authors.initials: MW
authors.lastname: Newman
authors.forename: J P
authors.initials: JP
authors.lastname: Holder
authors.forename: D H G
authors.initials: DH
authors.lastname: Schneider
authors.forename: T
authors.initials: T
authors.lastname: Schenkel
mesh_terms: D007477:Ions / Q000737:chemistry*; D008854:Microscopy, Electron / Q000379:methods; D012666:Semiconductors; D013057:Spectrum Analysis / Q000379:methods; D013499:Surface Properties
chemical_list: D007477:Ions