Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry.
We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
Zhong
Jingang
J
Department of Physics, Jinan University, Guangzhou 510632, China. tzjg@jnu.edu.cn
Weng
Jiawen
J
D000465:Algorithms; D005583:Fourier Analysis; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D010363:Pattern Recognition, Automated / Q000379:methods*