title: Optical techniques for imaging membrane topography.
abstract: In recent years three powerful optical imaging techniques have emerged that provide nanometer-scale information about the topography of membrane surfaces, whether cellular or artificial: intermembrane fluorescence resonance energy transfer (FRET), fluorescence interference contrast microscopy (FLIC), and reflection interference contrast microscopy (RICM). In intermembrane FRET, the sharp distance dependence of resonant energy transfer between fluorophores allows topographic measurements in the Angstrom to few-nanometer range. In FLIC and RICM, interference between light from a membrane (either from fluorescent probes, or reflected illumination) and light reflected by a planar substrate provide spatial sensitivity in the few to hundreds of nanometer range, with few-nanometer resolution. All of these techniques are fairly easy to implement. We discuss the physics and optics behind each of these tools, as well as practical concerns regarding their uses. We also provide examples of their application in imaging molecular-scale structures at intermembrane junctions.
authors.affiliation: Department of Chemistry, University of California, Berkeley, CA 94720, USA.
authors.forename: Raghuveer
authors.initials: R
authors.lastname: Parthasarathy
authors.forename: Jay T
authors.initials: JT
authors.lastname: Groves
mesh_terms: D000818:Animals; D001703:Biophysics / Q000379:methods; D002462:Cell Membrane / Q000378:metabolism*; D005453:Fluorescence; D031541:Fluorescence Resonance Energy Transfer / Q000379:methods*; D005456:Fluorescent Dyes / Q000494:pharmacology; D006801:Humans; D008027:Light; D008051:Lipid Bilayers / Q000737:chemistry*; D008856:Microscopy, Fluorescence / Q000379:methods*; D008858:Microscopy, Phase-Contrast / Q000379:methods*; D015233:Models, Statistical; D055095:Optics and Photonics; D010087:Oxides / Q000737:chemistry; D012822:Silicon Dioxide / Q000737:chemistry
chemical_list: D005456:Fluorescent Dyes; D008051:Lipid Bilayers; D010087:Oxides; D012822:Silicon Dioxide