A convenient and rapid sample repositioning approach for atomic force microscopy.
A novel repositioning approach is described for repeated observations of a specimen at a close proximal location in the atomic force microscope. The approach is similar to keystone architecture, whereby the repositioning is achieved by forming a male structured base for the specimen, and a corresponding female counterpart as the frame. For the combination of an acrylic acid frame and a metal base, 90% translation shifts are less than 10 microm, and almost all angular disorientations are within +3 degrees to -3 degrees . Nanometre-scale surface features can be relocated easily and reliably even after 40 imaging-removal-imaging cycles, dipping the specimen in solutions or heating up to 500 degrees C.
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Department of Materials Science and Engineering, Institute for Nanotechnology, Northwestern University, Evanston, IL 60208, USA.
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Dravid
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VP
D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013499:Surface Properties