Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes.
A new software tool, the maximum pixel spectrum, detects rare events within a spectrum image data cube, such as that generated with electron-excited energy-dispersive X-ray spectrometry in a scanning electron microscope. The maximum pixel spectrum is a member of a class of 'derived spectra' that are constructed from the spectrum image data cube. Similar to a conventional spectrum, a derived spectrum is a linear array of intensity vs. channel index that corresponds to photon energy. A derived spectrum has the principal characteristics of a real spectrum so that X-ray peaks can be recognized. A common example of a derived spectrum is the summation spectrum, which is a linear array in which the summation of all pixels within each energy plane gives the intensity value for that channel. The summation spectrum is sensitive to the dominant features of the data cube. The maximum pixel spectrum is constructed by selecting the maximum pixel value within each X-ray energy plane, ignoring the remaining pixels. Peaks corresponding to highly localized trace constituents or foreign contaminants, even those that are confined to one pixel of the image, can be seen at a glance when the maximum pixel spectrum is compared with the summation spectrum.
Bright
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National Institute of Standards and Technology, Gaithersburg, MD 20899-8370, USA.
Newbury
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D000535:Aluminum / Q000737:chemistry; D002857:Chromium / Q000737:chemistry; D003300:Copper / Q000737:chemistry; D003952:Diagnostic Imaging / Q000379:methods*; D004577:Electron Probe Microanalysis / Q000379:methods*; D007501:Iron / Q000737:chemistry; D009532:Nickel / Q000737:chemistry; D012984:Software; D014131:Trace Elements / Q000032:analysis
D014131:Trace Elements; D002857:Chromium; D003300:Copper; D009532:Nickel; D000535:Aluminum; D007501:Iron