Hysteresis effect in FePd magnetic stripes studied by coherent soft X-ray resonant magnetic scattering.
An FePd thin film sample, showing magnetic stripe domains as imaged by magnetic force microscopy, has been measured by soft X-ray resonant magnetic scattering in reflection geometry. Illumination with coherent radiation, produced by inserting a 20 microm pinhole in front of the sample, leads to a magnetic speckle pattern in the scattered intensity that gives access to the domain morphology. Application of an in-plane magnetic field for a few seconds gives a strong change in the observed intensity fluctuations, which indicates a large degree of variation between the two patterns taken before and after field exposure. From the speckle pattern we calculate a degree of coherence of beta = 0.5 for the incident beam.
Chesnel
K
K
ALS, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA. kchesnel@lbl.gov
van der Laan
G
G
Livet
F
F
Beutier
G
G
Marty
A
A
Belakhovsky
M
M
Haznar
A
A
Collins
S P
SP
D016880:Anisotropy; D003460:Crystallization / Q000379:methods*; D007501:Iron / Q000737:chemistry* / Q000528:radiation effects; D008280:Magnetics; D008422:Materials Testing; D036103:Nanotechnology / Q000379:methods*; D017711:Nonlinear Dynamics; D010165:Palladium / Q000737:chemistry* / Q000528:radiation effects; D014961:X-Ray Diffraction / Q000379:methods*
D010165:Palladium; D007501:Iron