title: Light dependency of resistance to ionizing radiation in Euglena gracilis.
abstract: The resistance of Euglena gracilis strains Z (wild type) and SM-ZK (chloroplast-deficient mutant) to ionizing radiation was investigated. The colony forming ability of E. gracilis strain Z was higher than that of strain SM-ZK after 60Cogamma-irradiation. For both strains, the resistance of light-grown cells was higher than that of dark-grown cells, suggesting that the light conditions during culture contribute to the radiation resistance of E. gracilis. The comet assay showed that the ability of rejoining DNA double-strand breaks (dsb) was much higher in the light-grown cells. These results suggest that E. gracilis possesses a light-induced repair system to cope with DNA dsb.
authors.affiliation: Research Institute for Advanced Science and Technology, Osaka Prefecture University, 1-1 Gakuencho, Sakai 599-8531, Japan.
authors.forename: Hirotaka
authors.initials: H
authors.lastname: Hayashi
authors.forename: Issay
authors.initials: I
authors.lastname: Narumi
authors.forename: Seiichi
authors.initials: S
authors.lastname: Wada
authors.forename: Masahiro
authors.initials: M
authors.lastname: Kikuchi
authors.forename: Masakazu
authors.initials: M
authors.lastname: Furuta
authors.forename: Kaku
authors.initials: K
authors.lastname: Uehara
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Watanabe
mesh_terms: D000818:Animals; D004249:DNA Damage / Q000528:radiation effects; D004307:Dose-Response Relationship, Radiation; D005056:Euglena gracilis / Q000235:genetics / Q000528:radiation effects*; D005720:Gamma Rays; D008027:Light; D009154:Mutation