Surface morphology and chemistry of Prunus laurocerasus L. leaves: a study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy.
The surface properties of the plant cuticle play a crucial role in plant-pathogen interactions and the retention and penetration of agriculturally important chemicals. This paper describes the use of X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF-SIMS), tapping-mode atomic force microscopy (TM-AFM) and scanning electron microscopy (SEM) to determine surface-specific chemical and material properties of the adaxial surface of Prunus laurocerasus L. leaves. XPS data, derived from the uppermost few nanometres (< 10 nm) of the leaf surface, were consistent with the wax components and functionality known to be present within the waxes. ToF-SIMS provided molecular speciation from the outermost monolayer of the leaf surface, indicating the importance of a family of acetates with chain lengths ranging from C20 to C34. The presence of alkanes with C29 and C31 chain lengths was also confirmed. SEM and TM-AFM topography images revealed a textured granular surface, while simultaneously recorded AFM phase images revealed heterogeneous material properties at the nanoscale. The relevance of these data to plant cuticle development, allelochemistry and agrochemical delivery is discussed.
Perkins
Mark C
MC
Laboratory of Biophysics and Surface Analysis, The School of Pharmacy, The University of Nottingham, University Park, Nottingham, NG7 2RD, UK.
Roberts
Clive J
CJ
Briggs
David
D
Davies
Martyn C
MC
Friedmann
Adrian
A
Hart
Clifford A
CA
Bell
Gordon A
GA
D018625:Microscopy, Atomic Force / Q000379:methods; D008855:Microscopy, Electron, Scanning / Q000379:methods; D018515:Plant Leaves / Q000737:chemistry* / Q000648:ultrastructure*; D027861:Prunus / Q000737:chemistry* / Q000648:ultrastructure*; D018629:Spectrometry, Mass, Secondary Ion