Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling.
We have developed a focused ion beam (FIB)-Ar ion-milling technique for high-resolution transmission electron microscopy. A micrometresized specimen was mounted on a cross section of metal foil of a few micrometres thick, using FIB microsampling. Following this, a 2 degrees wedgeshaped part was made in the specimen using FIB. Finally, the specimen was milled using an Ar ion beam to remove the FIB-damaged layers. We applied the FIB-Ar ion milling technique to a CeO(2)/Gd(2)Zr(2)O(7) multilayer specimen, resulting in the crystal lattice fringes of both layers being clearly observable in comparison to a specimen finished using a Ga ion beam at an accelerating voltage of 10 kV.
Sasaki
Hirokazu
H
Matsuda
Takeyoshi
T
Kato
Takeharu
T
Muroga
Takemi
T
Iijima
Yasuhiro
Y
Saitoh
Takashi
T
Iwase
Fusako
F
Yamada
Yutaka
Y
Izumi
Teruo
T
Shiohara
Yuh
Y
Hirayama
Tsukasa
T
D001128:Argon; D046529:Microscopy, Electron, Transmission; D013048:Specimen Handling / Q000379:methods*
D001128:Argon