Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape.
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
Kuljanishvili
Irma
I
Department of Physics and Astronomy, Michigan State University, 4237 Biomedical Physical Sciences, East Lansing, MI 48824-2320, USA.
Chakraborty
Subhasish
S
Maasilta
I J
IJ
Tessmer
S H
SH
Melloch
M R
MR
D000465:Algorithms; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods*; D008962:Models, Theoretical; D010069:Oxadiazoles
D010069:Oxadiazoles; C004184:methazole