title: Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms.
abstract: A new method has been developed for directly visualizing electromagnetic microfields in real time by the interference of four-electron waves obtained using a transmission electron microscope equipped with a field-emission gun and two electron biprisms. When one object wave and three reference waves interfere, equal-phase lines of the object wave are displayed as the intensity modulation of the interference fringes, in the manner same as in the three-electron-wave interference. The advantage of the four-electron-wave interference is that equal-phase lines are observed without precisely adjusting the angle between the two biprisms or rigorously controlling the fringe spacings of the two biprisms.
authors.affiliation: Japan Fine Ceramics Center, Atsuta-ku, Nagoya 456-8587, Japan.
authors.forename: Kimiya
authors.initials: K
authors.lastname: Miyashita
authors.forename: Kazuo
authors.initials: K
authors.lastname: Yamamoto
authors.forename: Tsukasa
authors.initials: T
authors.lastname: Hirayama
authors.forename: Takayoshi
authors.initials: T
authors.lastname: Tanji
mesh_terms: D006696:Holography / Q000295:instrumentation / Q000379:methods; D046529:Microscopy, Electron, Transmission / Q000295:instrumentation* / Q000379:methods*; D008857:Microscopy, Interference / Q000295:instrumentation* / Q000379:methods*; D055672:Static Electricity