title: Line frequency shift measurements by diode-laser spectroscopy for CH(3)D-Xe.
abstract: The pressure-induced Xe shifting and broadening coefficients for five lines of 12CH(3)D in the nu(3) band near 7.5 microm have been measured using a tunable diode-laser spectrometer. The frequency shift was determined from the simultaneous record of the Xe-broadened line and the same line of pure CH(3)D at low pressure. Comparisons are made with the results of theoretical calculations based on a semiclassical model involving the atom-atom Lennard-Jones (LJ) potential.
authors.affiliation: Laboratoire de Spectroscopie Moléculaire, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium.
authors.forename: Christophe
authors.initials: C
authors.lastname: Lerot
authors.forename: Jean-Pierre
authors.initials: JP
authors.lastname: Bouanich
authors.forename: Ghislain
authors.initials: G
authors.lastname: Blanquet
authors.forename: Jacques
authors.initials: J
authors.lastname: Walrand
authors.forename: Muriel
authors.initials: M
authors.lastname: Lepère
mesh_terms: D003903:Deuterium / Q000737:chemistry*; D007834:Lasers; D008697:Methane / Q000737:chemistry*; D013057:Spectrum Analysis; D014978:Xenon / Q000737:chemistry*
chemical_list: D014978:Xenon; D003903:Deuterium; D008697:Methane