title: Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape.
abstract: We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
authors.affiliation: Department of Physics and Astronomy, Michigan State University, 4237 Biomedical Physical Sciences, East Lansing, MI 48824-2320, USA.
authors.forename: Irma
authors.initials: I
authors.lastname: Kuljanishvili
authors.forename: Subhasish
authors.initials: S
authors.lastname: Chakraborty
authors.forename: I J
authors.initials: IJ
authors.lastname: Maasilta
authors.forename: S H
authors.initials: SH
authors.lastname: Tessmer
authors.forename: M R
authors.initials: MR
authors.lastname: Melloch
mesh_terms: D000465:Algorithms; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods*; D008962:Models, Theoretical; D010069:Oxadiazoles
chemical_list: D010069:Oxadiazoles; C004184:methazole