title: Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient.
abstract: Metastable long-period superstructures in an L10-TiAl single crystal with a composition gradient were observed successfully by transmission electron microscopy with a focused ion beam (FIB) microsampling technique. The composition gradient from 54.7 to 75 at.% Al with approximately 6 microm width was detected by electron probe microanalysis and foil specimens containing the composition-gradient area were fabricated by the FIB microsampling method. The foil specimens clearly exhibit sequential changes in long-period superstructure depending on the Al concentration.
authors.affiliation: Department of Applied Science for Electronics and Materials, Kyushu University, Fukuoka 816-8580, Japan. hata@asem.kyushu-u.ac.jp
authors.forename: Satoshi
authors.initials: S
authors.lastname: Hata
authors.forename: Kohjiro
authors.initials: K
authors.lastname: Shiraishi
authors.forename: Masaru
authors.initials: M
authors.lastname: Itakura
authors.forename: Noriyuki
authors.initials: N
authors.lastname: Kuwano
authors.forename: Takayoshi
authors.initials: T
authors.lastname: Nakano
authors.forename: Yukichi
authors.initials: Y
authors.lastname: Umakoshi
mesh_terms: D000497:Alloys / Q000737:chemistry*; D000535:Aluminum / Q000737:chemistry*; D003460:Crystallization; D046529:Microscopy, Electron, Transmission; D013048:Specimen Handling; D014025:Titanium / Q000737:chemistry*
chemical_list: D000497:Alloys; D000535:Aluminum; D014025:Titanium