title: Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images.
abstract: Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum of its through-focus series of images. In the observed lattice image of a wedgeshaped Si [110] crystal, we determined the magnitude of the contribution of the non-linear imaging components to the total image intensity distribution. The contribution was proved to become sometimes larger than that of the linear imaging component, even at a thickness of 13 nm.
authors.affiliation: Department of Material and Life Sciences, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan. nomaguchi@atom.mls.eng.osaka-u.ac.jp
authors.forename: Tsunenori
authors.initials: T
authors.lastname: Nomaguchi
authors.forename: Tadahiro
authors.initials: T
authors.lastname: Kawasaki
authors.forename: Yoshihide
authors.initials: Y
authors.lastname: Kimura
authors.forename: Yoshizo
authors.initials: Y
authors.lastname: Takai
mesh_terms: D005583:Fourier Analysis; D007091:Image Processing, Computer-Assisted; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D012825:Silicon / Q000737:chemistry*
chemical_list: D012825:Silicon