Reducing focused ion beam damage to transmission electron microscopy samples.
One of the most important applications of focused ion beam (FIB) systems is sample preparation for transmission electron microscopy (TEM). However, the use of the FIB inherently involves changing and damaging the sample, and thereby degrades the TEM resolution. This paper addresses the beam-induced damage and artifacts, particularly in applications involving silicon semiconductors. The damage appears in the form of amorphization on the surface of the TEM foil. The characteristics of this amorphous damage were studied by making TEM observations of cross sections of the affected foil. The damage is typically 20 to 30 nm thick for a 30 keV FIB, which is generally overly thick for modern silicon devices with feature sizes less than 250 nm. This paper reviews the reported damage depths of FIB-prepared samples, which are determined by experiments and calculations. Several damage reduction techniques, such as the use of gas-assisted etching, low energy FIB, cleaning the FIBfabricated cross section by wet or dry etching and cleaning by broad ion beam (BIB) milling have also been reviewed, with emphasis on applicability to silicon devices. We conclude that the use of low energy FIB and cleaning by argon BIB are particularly efficient techniques.
Kato
Naoko I
NI
Analytical Services, Quality Engineering, ITES Co., Ltd., Yasu-city, Shiga 520-2392, Japan. naokoik@jp.ibm.com
D016477:Artifacts; D046529:Microscopy, Electron, Transmission; D013048:Specimen Handling / Q000379:methods*