Analysing one isolated single walled carbon nanotube in the near-field domain with selective nanovolume Raman spectroscopy.
In this paper, we describe a new method to the selective nanovolume analysing of one isolated single walled carbon nanotube (SWNT). This concept is based on actually available imaging micro-spectrometry systems for working in near-field domain combined with a stigmatic solid immersion lens. This combination of different analytical methods, and modified and configured equipment entitles us to expand the functionality toward a three-dimensional (3D) nanovolume Raman mapping and photoluminescence intensity with a possible discrimination in polarization, as well as photoluminescence decaytime constant mapping with their unique combination. Subsequently, selective spectra can be acquired from the same location on the samples. By spectrally selecting a SWNT, we registered the spatial distribution of the emitted photons in x, y, z vectors to determine the position of a SWNT in the near-field domain. For the SWNTs that are localized with an accuracy better than 18 nm in the x, y and <1 nm in the z directions, we demonstrate an analytical sensitivity close to a single nanotube with unity throughput. This near-field capability is applied to resolve local variations unambiguously in the Raman spectrum along one single SWNT. Finally, in this paper, we report what we believe to be the first evidence of Raman mapping and 3D real optical imaging of carbon nanotubes with near-field resolution.
Atalay
Han
H
Inst. des Mat. Jean Rouxel-CNRS, Univ. de Nantes 2, rue de la Houssiniere-44322 Nantes cedex 03-BP 32229, France.
Lefrant
Serge
S
D007091:Image Processing, Computer-Assisted; D008027:Light; D049449:Luminescence; D008163:Luminescent Measurements; D018613:Microscopy, Confocal; D020527:Microscopy, Scanning Probe / Q000379:methods; D008962:Models, Theoretical; D036103:Nanotechnology / Q000379:methods*; D043942:Nanotubes / Q000737:chemistry; D037742:Nanotubes, Carbon / Q000737:chemistry*; D017785:Photons; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D012984:Software; D013059:Spectrum Analysis, Raman / Q000379:methods*; D013696:Temperature
D037742:Nanotubes, Carbon