title: Strain induced deep electronic states around threading dislocations in GaN.
abstract: Combining through-focus high-resolution transmission electron microscopy and hierarchical multiscale simulations consisting of density-functional theory, analytical empirical potentials, and continuum elastic theory we demonstrate the existence of a new dislocation type in GaN. In contrast with all previously identified or suggested dislocation structures in GaN, all core atoms are fully coordinated; i.e., no broken bonds occur, implying that the dislocation should be electrically inactive. However, as we show, the giant local strain-field around the dislocation core, in combination with the small lattice constant of GaN, causes deep defect states and thus electrically active edge dislocations independent on the specific core structure.
authors.affiliation: Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin (Dahlem), Germany.
authors.forename: L
authors.initials: L
authors.lastname: Lymperakis
authors.forename: J
authors.initials: J
authors.lastname: Neugebauer
authors.forename: M
authors.initials: M
authors.lastname: Albrecht
authors.forename: T
authors.initials: T
authors.lastname: Remmele
authors.forename: H P
authors.initials: HP
authors.lastname: Strunk