Identifying defects in nanoscale materials.
We have developed a novel iterative experimental-theoretical technique which can identify the atomic structure of defects in many-atom nanoscale materials from scanning tunneling microscopy and spectroscopy data. A given model for a defect structure is iteratively improved until calculated microscopy and spectroscopy data based on the model converge on the experimental results. We use the technique to identify a defect responsible for the electronic properties of a carbon nanotube intramolecular junction. Our technique can be extended for analysis of defect structures in nanoscale materials in general.
Ishigami
Masa
M
Department of Physics, University of California at Berkeley, Berkeley, California 94720, USA.
Choi
Hyoung Joon
HJ
Aloni
Shaul
S
Louie
Steven G
SG
Cohen
Marvin L
ML
Zettl
A
A