title: Resolving conflicting crystallographic and NMR models for solution-state DNA with solution X-ray diffraction.
abstract: We report on synchrotron-based high-angle X-ray solution scattering measured to 2 A resolution for two synthetic DNA sequences for which there are conflicting X-ray crystal and solution NMR models. Our results demonstrate that high-angle X-ray scattering discriminates between differing X-ray crystal and NMR models for solution-state DNA and provides a direct, independent method for testing structural models and measuring solution-state configurational dispersions.
authors.affiliation: Chemistry Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA.
authors.forename: Xiaobing
authors.initials: X
authors.lastname: Zuo
authors.forename: David M
authors.initials: DM
authors.lastname: Tiede
mesh_terms: D018360:Crystallography, X-Ray; D004247:DNA / Q000737:chemistry*; D008958:Models, Molecular; D019906:Nuclear Magnetic Resonance, Biomolecular; D009690:Nucleic Acid Conformation; D012996:Solutions; D014961:X-Ray Diffraction
chemical_list: D012996:Solutions; D004247:DNA