Numerical simulation of scanning electrochemical microscopy experiments with frame-shaped integrated atomic force microscopy--SECM probes using the boundary element method.
Integrated submicroelectrodes for combined AFM-SECM measurements are characterized with numerical simulations using the boundary element method. SECM approach curves and SECM images are calculated and analyzed for a model substrate containing pronounced topographical and electrochemical features. The theoretically calculated image has been compared to the experimental data and shows excellent quantitative agreement. Hence, the applicability of integrated AFM-SECM electrodes for combined electrochemical and topographical imaging and a profound theoretical description including quantification of the obtained results are demonstrated.
Sklyar
Oleg
O
School of Mathematics and Natural Sciences, Carl Von Ossietzky University of Oldenburg, D-26111 Oldenburg, Germany.
Kueng
Angelika
A
Kranz
Christine
C
Mizaikoff
Boris
B
Lugstein
Alois
A
Bertagnolli
Emmerich
E
Wittstock
Gunther
G
D004563:Electrochemistry; D008433:Mathematics; D008839:Microelectrodes; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation / Q000379:methods*; D011199:Potentiometry; D019371:Topography, Medical