title: Extinction coefficients and purity of single-walled carbon nanotubes.
abstract: Single-walled carbon nanotubes (SWNTs) hold great promise for advanced applications in aerospace, electronics and medicine, yet these industries require materials with rigorous quality control. There are currently no accepted standards for quality assurance or quality control among the commercial suppliers of SWNTs. We briefly discuss the applicability of various techniques to measure SWNT purity and review, in detail, the advantages of near infrared (NIR) spectroscopy for the quantitative assessment of the bulk carbonaceous purity of SWNTs. We review the use of solution phase NIR spectroscopy for the analysis and characterization of a variety of carbon materials, emphasizing SWNTs produced by the electric arc (EA), laser oven (LO) and HiPco (HC) methods. We consider the applicability of Beer's law to carbon materials dispersed in dimethylformamide (DMF) and the effective extinction coefficients that are obtained from such dispersions. Analysis of the areal absorptivities of the second interband transition of semiconducting EA-produced SWNTs for a number of samples of differing purities has lead to an absolute molar extinction coefficient for the carbonaceous impurities in EA-produced SWNT samples. We conclude that NIR spectroscopy is the clear method of choice for the assessment of the bulk carbonaceous purity of EA-produced SWNTs, and we suggest that an absolute determination of the purity of SWNTs is within reach. Continued work in this area is expected to lead to a universal method for the assessment of the absolute bulk purity of SWNTs from all sources--such a development will be of great importance for nanotube science and for future customers for this product.
authors.affiliation: Center for Nanoscale Science and Engineering, Departments of Chemistry and Chemical and Environmental Engineering, University of California, Riverside, California 92521-0403, USA.
authors.forename: B
authors.initials: B
authors.lastname: Zhao
authors.forename: M E
authors.initials: ME
authors.lastname: Itkis
authors.forename: S
authors.initials: S
authors.lastname: Niyogi
authors.forename: H
authors.initials: H
authors.lastname: Hu
authors.forename: D E
authors.initials: DE
authors.lastname: Perea
authors.forename: R C
authors.initials: RC
authors.lastname: Haddon
mesh_terms: D008422:Materials Testing / Q000379:methods* / Q000592:standards; D037742:Nanotubes, Carbon / Q000032:analysis* / Q000737:chemistry* / Q000592:standards; D011786:Quality Control; D012016:Reference Values; D013055:Spectrophotometry, Infrared / Q000379:methods* / Q000592:standards
chemical_list: D037742:Nanotubes, Carbon