title: Numerical simulation of scanning electrochemical microscopy experiments with frame-shaped integrated atomic force microscopy--SECM probes using the boundary element method.
abstract: Integrated submicroelectrodes for combined AFM-SECM measurements are characterized with numerical simulations using the boundary element method. SECM approach curves and SECM images are calculated and analyzed for a model substrate containing pronounced topographical and electrochemical features. The theoretically calculated image has been compared to the experimental data and shows excellent quantitative agreement. Hence, the applicability of integrated AFM-SECM electrodes for combined electrochemical and topographical imaging and a profound theoretical description including quantification of the obtained results are demonstrated.
authors.affiliation: School of Mathematics and Natural Sciences, Carl Von Ossietzky University of Oldenburg, D-26111 Oldenburg, Germany.
authors.forename: Oleg
authors.initials: O
authors.lastname: Sklyar
authors.forename: Angelika
authors.initials: A
authors.lastname: Kueng
authors.forename: Christine
authors.initials: C
authors.lastname: Kranz
authors.forename: Boris
authors.initials: B
authors.lastname: Mizaikoff
authors.forename: Alois
authors.initials: A
authors.lastname: Lugstein
authors.forename: Emmerich
authors.initials: E
authors.lastname: Bertagnolli
authors.forename: Gunther
authors.initials: G
authors.lastname: Wittstock
mesh_terms: D004563:Electrochemistry; D008433:Mathematics; D008839:Microelectrodes; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation / Q000379:methods*; D011199:Potentiometry; D019371:Topography, Medical