title: A new TEM method of interfacial thin-film characterization.
abstract: Nano-scale thin films are of wide interest. The distribution of angles between the grain-boundary plane and the surfaces of such films can affect their mechanical behaviour. A transmission electron microscopy method is described to measure the distribution of such angles. This method is based on the well-known double-diffraction effect from two overlapping grains, but its implementation at multiple interfaces is made practically feasible by recent advances in computer and digital imaging techniques, as demonstrated in this paper.
authors.affiliation: Department of Physics, Portland State University, OR 97207, USA. chunfei@pdx.edu
authors.forename: Chunfei
authors.initials: C
authors.lastname: Li
authors.forename: David B
authors.initials: DB
authors.lastname: Williams