title: Errors, artifacts, and improvements in EBSD processing and mapping.
abstract: Electron back scatter diffraction (EBSD) mapping and indexing has rapidly come into widespread use. However, inadequate attention has been paid to the details of the method. Many of the algorithms in current use were chosen because they were the first ones that were found to work, rather than because they were optimum. Results of systematic study are presented. It is shown that more than one method can successfully correct a sampling artifact, that there is an optimum binning ratio, that Gaussian filtering provides an alternative to "butterfly convolution," that better alternatives for mapping image quality than those in current use are available, and that saving all the original patterns is practical and advantageous.
authors.affiliation: Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015-3198, USA.
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Tao
authors.forename: Alwyn
authors.initials: A
authors.lastname: Eades