On the imaging of the flux-line lattice of a type-II superconductor by soft X-ray absorption microscopy.
A new method is proposed for the imaging of the flux-line lattice of a type-II superconductor by soft X-ray absorption microscopy. It is shown that the method is very demanding but probably realisable in the foreseeable future. The new method has the potential to image in real space static and dynamical properties of the flux-line lattice at arbitrary external fields and with single-flux-line resolution.
Fähnle
M
M
Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, 70569 Stuttgart, Germany. faehnle@mf.mpg.de
Albrecht
J
J
Eimüller
T
T
Fischer
P
P
Goering
E
E
Steiauf
D
D
Schütz
G
G