title: An X-ray nanodiffraction technique for structural characterization of individual nanomaterials.
abstract: An X-ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion-device beamline of the Advanced Photon Source. Using the extremely high brightness of the third-generation synchrotron radiation source and advanced high-resolution high-energy zone-plate focusing optics, X-rays of energies from 6 to 12 keV have been focused into a spot smaller than 200 nm with a photon density gain of more than 50,000 so that significant photon flux can be intercepted by a nanoscale material to generate a measurable diffraction signal for structural characterization. This paper describes the instrumentation of the technique and discusses the application of the technique to studies of tin oxide nanobelts.
authors.affiliation: Experimental Facilities Division, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Y
authors.initials: Y
authors.lastname: Xiao
authors.forename: Z
authors.initials: Z
authors.lastname: Cai
authors.forename: Z L
authors.initials: ZL
authors.lastname: Wang
authors.forename: B
authors.initials: B
authors.lastname: Lai
authors.forename: Y S
authors.initials: YS
authors.lastname: Chu