In situ synchrotron X-ray studies of ferroelectric thin films.
In situ synchrotron X-ray scattering was used to observe both the growth of PbTiO3 films by metal-organic chemical vapour deposition and the behaviour of the ferroelectric phase transition as a function of film thickness. The dependences of growth mode and deposition rate on gas flows and substrate temperature were determined by homoepitaxial growth studies on thick films (>50 nm). These studies facilitated the growth of thin coherently strained PbTiO3 films on SrTiO3 (001) substrates, with thicknesses ranging from 2 to 42 nm. Experiments on the ferroelectric phase transition as a function of film thickness were carried out in these films under controlled mechanical and electrical boundary conditions.
Fong
D D
DD
Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA.
Eastman
J A
JA
Stephenson
G B
GB
Fuoss
P H
PH
Streiffer
S K
SK
Thompson
Carol
C
Auciello
O
O