[Plane scan analysis of the surface of white and blue porcelain by SRXRF method].
In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements, i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr, into three groups. This phenomenon will indicate how to search the "finger elements" in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze.
Yang
Yi-Min
YM
Department of Science and Technology Archaeology, University of Science and Technology of China, Hefei 230026, China.
Feng
Min
M
Zhu
Jian
J
Mao
Zhen-Wei
ZW
Wang
Chang-Sui
CS
Huang
Yu-Ying
YY
He
Wei
W