A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of approximately 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
Hutchison
John L
JL
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. john.hutchison@materials.ox.ac.uk
Titchmarsh
John M
JM
Cockayne
David J H
DJ
Doole
Ron C
RC
Hetherington
Crispin J D
CJ
Kirkland
Angus I
AI
Sawada
H
H