title: Simple method for accurate characterization of birefringent crystals.
abstract: We present a simple method to determine the cutting angle and thickness of birefringent crystals. Our method is based on chromatic polarization interferometry and allows for accuracies of typically 0.1 degrees in the cutting angle and 0.5% in the thickness.
authors.affiliation: Huygens Laboratory, Leiden University, 2300 RA Leiden, The Netherlands. peter@molphys.leidenuniv.nl
authors.forename: Peter S K
authors.initials: PS
authors.lastname: Lee
authors.forename: J B
authors.initials: JB
authors.lastname: Pors
authors.forename: Martin P
authors.initials: MP
authors.lastname: van Exter
authors.forename: J P
authors.initials: JP
authors.lastname: Woerdman