title: A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples.
abstract: A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
authors.affiliation: Precision Engineering Research Institute, Harbin Institute of Technology 413, Harbin, Heilongjiang 150001, China. caoyongzhi1@yahoo.com.cn
authors.forename: Yongzhi
authors.initials: Y
authors.lastname: Cao
authors.forename: Yingchun
authors.initials: Y
authors.lastname: Liang
authors.forename: Shen
authors.initials: S
authors.lastname: Dong
authors.forename: You
authors.initials: Y
authors.lastname: Wang