title: [Plane scan analysis of the surface of white and blue porcelain by SRXRF method].
abstract: In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements, i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr, into three groups. This phenomenon will indicate how to search the "finger elements" in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze.
authors.affiliation: Department of Science and Technology Archaeology, University of Science and Technology of China, Hefei 230026, China.
authors.forename: Yi-Min
authors.initials: YM
authors.lastname: Yang
authors.forename: Min
authors.initials: M
authors.lastname: Feng
authors.forename: Jian
authors.initials: J
authors.lastname: Zhu
authors.forename: Zhen-Wei
authors.initials: ZW
authors.lastname: Mao
authors.forename: Chang-Sui
authors.initials: CS
authors.lastname: Wang
authors.forename: Yu-Ying
authors.initials: YY
authors.lastname: Huang
authors.forename: Wei
authors.initials: W
authors.lastname: He