title: Atomic XAFS as a tool to probe the electronic properties of supported noble metal nanoclusters.
abstract: Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe molecule is required and that real-time measurements under reaction conditions are possible.
authors.affiliation: Department of Inorganic Chemistry and Catalysis, Debye Institute, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, The Netherlands.
authors.forename: Ad M J
authors.initials: AM
authors.lastname: van der Eerden
authors.forename: Tom
authors.initials: T
authors.lastname: Visser
authors.forename: T Alexander
authors.initials: TA
authors.lastname: Nijhuis
authors.forename: Yasuo
authors.initials: Y
authors.lastname: Ikeda
authors.forename: Muriel
authors.initials: M
authors.lastname: Lepage
authors.forename: Diek C
authors.initials: DC
authors.lastname: Koningsberger
authors.forename: Bert M
authors.initials: BM
authors.lastname: Weckhuysen