[The influence of thickness of SiO2 on the electron acceleration in cathodluminescence-like emission].
The authors investigated the property of cathodluminescence-like (CL-like) emission in the device of MEH-PPV sandwiched between two SiO2 layers. The authors observed in addition to the inherent electroluminescence of MEH-PPV, a shorter emission peak which is considered to be corresponding to HOMO-LUMO transition. From the relative change of these two peaks with the variation of the thickness of SiO2, The authors studied the electron acceleration ability of SiO2.
Liu
Shan-shan
SS
Institute of Optoelectronics Technology, Key Laboratory of Information Storage and Display, Beijing Jiaotong University, Beijing 100044, China.
Teng
Feng
F
Xu
Zheng
Z
Liu
Ming
M
Sun
Shi-ju
SJ
Xu
Xu-rong
XR