title: [The influence of thickness of SiO2 on the electron acceleration in cathodluminescence-like emission].
abstract: The authors investigated the property of cathodluminescence-like (CL-like) emission in the device of MEH-PPV sandwiched between two SiO2 layers. The authors observed in addition to the inherent electroluminescence of MEH-PPV, a shorter emission peak which is considered to be corresponding to HOMO-LUMO transition. From the relative change of these two peaks with the variation of the thickness of SiO2, The authors studied the electron acceleration ability of SiO2.
authors.affiliation: Institute of Optoelectronics Technology, Key Laboratory of Information Storage and Display, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Shan-shan
authors.initials: SS
authors.lastname: Liu
authors.forename: Feng
authors.initials: F
authors.lastname: Teng
authors.forename: Zheng
authors.initials: Z
authors.lastname: Xu
authors.forename: Ming
authors.initials: M
authors.lastname: Liu
authors.forename: Shi-ju
authors.initials: SJ
authors.lastname: Sun
authors.forename: Xu-rong
authors.initials: XR
authors.lastname: Xu