A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples.
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
Cao
Yongzhi
Y
Precision Engineering Research Institute, Harbin Institute of Technology 413, Harbin, Heilongjiang 150001, China. caoyongzhi1@yahoo.com.cn
Liang
Yingchun
Y
Dong
Shen
S
Wang
You
Y