Simple method for accurate characterization of birefringent crystals.
We present a simple method to determine the cutting angle and thickness of birefringent crystals. Our method is based on chromatic polarization interferometry and allows for accuracies of typically 0.1 degrees in the cutting angle and 0.5% in the thickness.
Lee
Peter S K
PS
Huygens Laboratory, Leiden University, 2300 RA Leiden, The Netherlands. peter@molphys.leidenuniv.nl
Pors
J B
JB
van Exter
Martin P
MP
Woerdman
J P
JP