title: A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
abstract: A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of approximately 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
authors.affiliation: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. john.hutchison@materials.ox.ac.uk
authors.forename: John L
authors.initials: JL
authors.lastname: Hutchison
authors.forename: John M
authors.initials: JM
authors.lastname: Titchmarsh
authors.forename: David J H
authors.initials: DJ
authors.lastname: Cockayne
authors.forename: Ron C
authors.initials: RC
authors.lastname: Doole
authors.forename: Crispin J D
authors.initials: CJ
authors.lastname: Hetherington
authors.forename: Angus I
authors.initials: AI
authors.lastname: Kirkland
authors.forename: H
authors.initials: H
authors.lastname: Sawada