[Determination of composition of electronic material by fundamental parameter method of XRF].
The fundamental parameters (FP) method of XRF in determination of the composition of electronic ceramic materials is studied. The fundamental parameters needed in calculation are developed by math calculation and the program is developed in C language. The method can also be used in determination of the composition of alloy. Some samples are analysed by this method and the relative derivation is less than 3%.
Sui
S
S
University of Electronic Science & Technology of China, 610054 Chengdu.
Wei
J
J
Shi
Q
Q