title: Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy.
abstract: Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single-electron tunneling between the dot and the back electrode governed by the Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the "force version" of the Coulomb blockade effect.
authors.affiliation: Department of Physics, McGill University, 3600 rue University, Montreal, H3A2T8, Canada.
authors.forename: Romain
authors.initials: R
authors.lastname: Stomp
authors.forename: Yoichi
authors.initials: Y
authors.lastname: Miyahara
authors.forename: Sacha
authors.initials: S
authors.lastname: Schaer
authors.forename: Qingfeng
authors.initials: Q
authors.lastname: Sun
authors.forename: Hong
authors.initials: H
authors.lastname: Guo
authors.forename: Peter
authors.initials: P
authors.lastname: Grutter
authors.forename: Sergei
authors.initials: S
authors.lastname: Studenikin
authors.forename: Philip
authors.initials: P
authors.lastname: Poole
authors.forename: Andy
authors.initials: A
authors.lastname: Sachrajda