title: [Grazing techniques and x-ray fluorescence analysis].
abstract: X-ray analysis has become a new analysis method of material and thin film. Using this method, we can obtain much information on material such as density, layer thickness, interface roughness and compositional depth profile. Application and development of grazing technique in X-ray fluorescence analysis are introduced in this paper.
authors.affiliation: Institute of High Energy Physics, Academia Sinica, 100080 Beijing.
authors.forename: Y
authors.initials: Y
authors.lastname: Liu
authors.forename: H
authors.initials: H
authors.lastname: Xiao