title: [Measurement for optical nonlinearity and optical bistability in II - VI semiconductor by optical waveguide method].
abstract: The untransparent substrates on the epitaxial layer need not be etched out from chemistry etching to prepare the "window" through light. The optical absorption, optical nonlinearities and optical bistabilities of the semiconductor thin films with the nanostructure grown on the untransparent substrates can be directly measured by the end face coupling method of optical waveguide. Meanwhile, the several experiment examples of II - VI single crystal thin films and superlattices grown on GaAs substrate are demonstrated in this paper.
authors.affiliation: Changchun Institute of Physics, Academia Sinica, 130021 Changchun.
authors.forename: Z
authors.initials: Z
authors.lastname: Zheng
authors.forename: Z
authors.initials: Z
authors.lastname: Guan
authors.forename: X
authors.initials: X
authors.lastname: Fan