title: X-ray absorption spectroscopy to probe surface composition and surface deprotection in photoresist films.
abstract: Near-edge X-ray absorption fine structure spectroscopy (NEXAFS) is utilized to provide insight into surface chemical effects in model photoresist films. First, NEXAFS was used to examine the resist/air interface including surface segregation of a photoacid generator (PAG) and the extent of surface deprotection in the film. The concentration of PAG at the resist-air interface was higher than the bulk concentration, which led to a faster deprotection rate at that interface. Second, a NEXAFS depth profiling technique was utilized to probe for compositional gradients in model resist line edge regions. In the model line edge region, the surface composition profile for the developed line edge was dependent on the post exposure bake time.
authors.affiliation: Sandia National Laboratories, P.O. Box 5800, MS 0888, Albuquerque, NM 87185, USA. jllenha@sandia.gov
authors.forename: Joseph L
authors.initials: JL
authors.lastname: Lenhart
authors.forename: Daniel A
authors.initials: DA
authors.lastname: Fischer
authors.forename: Sharadha
authors.initials: S
authors.lastname: Sambasivan
authors.forename: Eric K
authors.initials: EK
authors.lastname: Lin
authors.forename: Ronald L
authors.initials: RL
authors.lastname: Jones
authors.forename: Christopher L
authors.initials: CL
authors.lastname: Soles
authors.forename: Wen-Li
authors.initials: WL
authors.lastname: Wu
authors.forename: Dario L
authors.initials: DL
authors.lastname: Goldfarb
authors.forename: Marie
authors.initials: M
authors.lastname: Angelopoulos