title: [Direct determination of trace elements in tungsten products with ICP-AES].
abstract: A direct determination of Al, As, Ca, Cd, Co, Cr, Cu, Fe, Mg, Mn, Mo, Ni, Sn, Ti and V in tungsten products with ICP-AES is presented. The influence of tungsten matrix is studied. Based on the selected optimum operating parameters, the feasibility of the proposed method is evaluated by analyzing three WO3 National References. The results are satisfactory.
authors.affiliation: Department of Chemistry, Zhongshan University, 510275 Guangzhou.
authors.forename: X
authors.initials: X
authors.lastname: Yang
authors.forename: L
authors.initials: L
authors.lastname: Wang
authors.forename: B
authors.initials: B
authors.lastname: Tang
authors.forename: Z
authors.initials: Z
authors.lastname: Zhang
authors.forename: B
authors.initials: B
authors.lastname: He
authors.forename: J
authors.initials: J
authors.lastname: Li
authors.forename: T
authors.initials: T
authors.lastname: Peng