title: Oriented carbon nanostructures containing nitrogen obtained by ion beam assisted deposition.
abstract: In this paper, we report the deposition of graphite multilayer containing nitrogen covering nanometric nickel particles. In-situ photoelectron emission spectroscopy (XPS) reveals the presence of nitrogen in the carbon layer covering the nickel particles. The field emission properties of the structures are reported. Atomic force microscopy displays regular domelike structures. Raman spectroscopy shows the characteristic frequencies associated with graphite and disordered structures. High-resolution transmission electron microscopy confirms the presence of multiwall well-organized graphite layers covering the nickel particles. Disorder increases on increasing nitrogen content. The samples were prepared in-situ by depositing first a few atomic layers of nickel and subsequent islands formation by thermal annealing. Then, an argon ion beam bombards an ultrapure carbon target and simultaneously the growing film is assisted with a second low-energy nitrogen ion beam (ion beam assisted deposition).
authors.affiliation: Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas, Unicamp 13083-970, Campinas, São Paulo, Brazil.
authors.forename: P
authors.initials: P
authors.lastname: Paredez
authors.forename: C A
authors.initials: CA
authors.lastname: Figueroa
authors.forename: L F
authors.initials: LF
authors.lastname: Zagonel
authors.forename: F R
authors.initials: FR
authors.lastname: Reichert
authors.forename: C R M
authors.initials: CR
authors.lastname: Ribeiro
authors.forename: S
authors.initials: S
authors.lastname: Point
authors.forename: C
authors.initials: C
authors.lastname: Godon
authors.forename: T M
authors.initials: TM
authors.lastname: Minea
authors.forename: F
authors.initials: F
authors.lastname: Alvarez
mesh_terms: D001128:Argon / Q000737:chemistry; D002244:Carbon / Q000737:chemistry*; D006108:Graphite / Q000737:chemistry; D006358:Hot Temperature; D007477:Ions; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D046529:Microscopy, Electron, Transmission; D049329:Nanostructures / Q000737:chemistry*; D009532:Nickel / Q000737:chemistry; D009584:Nitrogen / Q000737:chemistry*; D010084:Oxidation-Reduction; D012825:Silicon / Q000737:chemistry; D013052:Spectrometry, X-Ray Emission; D013059:Spectrum Analysis, Raman
chemical_list: D007477:Ions; D001128:Argon; D002244:Carbon; D006108:Graphite; D009532:Nickel; D009584:Nitrogen; D012825:Silicon