Characterization of a second-order nonlinear layer profile in thermally poled optical fibers with second-harmonic microscopy.
Second-harmonic microscopy has been successfully applied to characterize the second-order nonlinear layer in optical fibers thermally poled at 280 degrees C and 3.5 kV for 30 min. The nonlinear layer was found to be approximately 5.1 microm deep under the anode and was not always centered about the closest point between the electrodes.
An
Honglin
H
Optical Fibre Technology Centre, Australian Photonics CRC, University of Sydney, Australian Technology Park, Eveleigh, NSW 1430, Australia. h.an@oftc.usyd.edu.au
Fleming
Simon
S