title: Simultaneous measurement of various optical parameters in a multilayer optical waveguide by a Michelson precision reflectometer.
abstract: A novel reflectometer based on Michelson interference is proposed and used to measure various optical parameters of homogeneous multilayer optical waveguides. Refractive indices, thickness, insertion loss, absorbed loss, Fresnel reflectance, and diffuse reflection coefficients of optical waveguides can be measured simultaneously.
authors.affiliation: State Key Laboratory on Fiber-Optic Local Area Network and Advanced Optical Communication Systems, Shanghai Jiao Tong University, Shanghai 200030, China.
authors.forename: Yi-Ping
authors.initials: YP
authors.lastname: Wang
authors.forename: Jian-Ping
authors.initials: JP
authors.lastname: Chen
authors.forename: Xin-Wan
authors.initials: XW
authors.lastname: Li
authors.forename: Xiao-Hong
authors.initials: XH
authors.lastname: Zhang
authors.forename: Jian-Xun
authors.initials: JX
authors.lastname: Hong
authors.forename: Ai-Lun
authors.initials: AL
authors.lastname: Ye