Mechanically engraved mica surface using the atomic force microscope tip facilitates return to a specific sample location.
By controlling the interaction between the atomic force microscope tip and mica, patterns of different sizes and shape have been produced on the surface of mica. Using these operator-constructed patterns as a reliable marker, the original scanned sample location can be re-located and imaged again on the same mica surface by atomic force microscopy (AFM). This location technique can be used to find the same object again even if the sample was removed from the AFM instrument or the sample was imaged in a different mode.
Liu
Zhiguo
Z
State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Graduate School of the Chinese Academy of Sciences, Chinese Academy of Sciences, Changchun, Jilin, 130022, China.
Li
Zhuang
Z
Zhou
Hualan
H
Wei
Gang
G
Song
Yonghai
Y
Wang
Li
L
D000538:Aluminum Silicates / Q000737:chemistry*; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D008863:Microspheres; D010957:Plasmids; D011137:Polystyrenes; D013499:Surface Properties
D000538:Aluminum Silicates; D011137:Polystyrenes; C011934:mica