Enlarged longitudinal dose profiles in cone-beam CT and the need for modified dosimetry.
In order to examine phantom length necessary to assess radiation dose delivered to patients in cone-beam CT with an enlarged beamwidth, we measured dose profiles in cylindrical phantoms of sufficient length using a prototype 256-slice CT-scanner developed at our institute. Dose profiles parallel to the rotation axis were measured at the central and peripheral positions in PMMA (polymethylmethacrylate) phantoms of 160 or 320 mm diameter and 900 mm length. For practical application, we joined unit cylinders (150 mm long) together to provide phantoms of 900 mm length. Dose profiles were measured with a pin photodiode sensor having a sensitive region of approximately 2.8 x 2.8 mm2 and 2.7 mm thickness. Beamwidths of the scanner were varied from 20 to 138 mm. Dose profile integrals (DPI) were calculated using the measured dose profiles for various beamwidths and integration ranges. For the body phantom (320-mm-diam phantom), 76% of the DPI was represented for a 20 mm beamwidth and 60% was represented for a 138 mm beamwidth if dose profiles were integrated over a 100 mm range, while more than 90% of the DPI was represented for beamwidths between 20 and 138 mm if integration was carried out over a 300 mm range. The phantom length and integration range for dosimetry of cone-beam CT needed to be more than 300 mm to represent more than 90% of the DPI for the body phantom with the beamwidth of more than 20 mm. Although we reached this conclusion using the prototype 256-slice CT-scanner, it may be applied to other multislice CT-scanners as well.
Mori
Shinichiro
S
National Institute of Radiological Sciences, Chiba 263-8555, Japan.
Endo
Masahiro
M
Nishizawa
Kanae
K
Tsunoo
Takanori
T
Aoyama
Takahiko
T
Fujiwara
Hideaki
H
Murase
Kenya
K
D006257:Head / Q000473:pathology; D006801:Humans; D015233:Models, Statistical; D019047:Phantoms, Imaging; D019904:Polymethyl Methacrylate / Q000737:chemistry; D011829:Radiation Dosage; D011874:Radiometry; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry; D015898:Tomography Scanners, X-Ray Computed; D036542:Tomography, Spiral Computed / Q000379:methods; D014057:Tomography, X-Ray Computed / Q000379:methods*
D019904:Polymethyl Methacrylate; D012825:Silicon