title: Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction".
authors.affiliation: School of Physics, Georgia Institute of Technology, 837 State Street, Atlanta, GA 30332-0430, USA.
authors.forename: Angelo
authors.initials: A
authors.lastname: Bongiorno
authors.forename: Alfredo
authors.initials: A
authors.lastname: Pasquarello