Simultaneous measurement of various optical parameters in a multilayer optical waveguide by a Michelson precision reflectometer.
A novel reflectometer based on Michelson interference is proposed and used to measure various optical parameters of homogeneous multilayer optical waveguides. Refractive indices, thickness, insertion loss, absorbed loss, Fresnel reflectance, and diffuse reflection coefficients of optical waveguides can be measured simultaneously.
Wang
Yi-Ping
YP
State Key Laboratory on Fiber-Optic Local Area Network and Advanced Optical Communication Systems, Shanghai Jiao Tong University, Shanghai 200030, China.
Chen
Jian-Ping
JP
Li
Xin-Wan
XW
Zhang
Xiao-Hong
XH
Hong
Jian-Xun
JX
Ye
Ai-Lun
AL