title: Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV.
abstract: Resonant inelastic X-ray scattering with very high energy resolution is a promising technique for investigating the electronic structure of strongly correlated materials. The demands for this technique are analyzers which deliver an energy resolution of the order of 200 meV full width at half-maximum or below, at energies corresponding to the K-edges of transition metals (Cu, Ni, Co etc.). To date, high resolution under these conditions has been achieved only with diced Ge analyzers working at the Cu K-edge. Here, by perfecting each aspect of the fabrication, it is shown that spherically bent Si analyzers can provide the required energy resolution. Such analyzers have been successfully produced and have greatly improved the energy resolution in standard spherically bent analyzers.
authors.affiliation: Laboratoire de Minéralogie-Cristallographie de Paris, Université Paris 6, Université Paris 7, CNRS, IPGP, Case 115, 4 Place Jussieu, 75252 Paris CEDEX 05, France.
authors.forename: Emilie
authors.initials: E
authors.lastname: Collart
authors.forename: Abhay
authors.initials: A
authors.lastname: Shukla
authors.forename: Frédéric
authors.initials: F
authors.lastname: Gélébart
authors.forename: Marc
authors.initials: M
authors.lastname: Morand
authors.forename: Cécile
authors.initials: C
authors.lastname: Malgrange
authors.forename: Nathalie
authors.initials: N
authors.lastname: Bardou
authors.forename: Ali
authors.initials: A
authors.lastname: Madouri
authors.forename: Jean Luc
authors.initials: JL
authors.lastname: Pelouard
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D012542:Scattering, Radiation; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D014159:Transducers; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods; D014965:X-Rays