Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV.
Resonant inelastic X-ray scattering with very high energy resolution is a promising technique for investigating the electronic structure of strongly correlated materials. The demands for this technique are analyzers which deliver an energy resolution of the order of 200 meV full width at half-maximum or below, at energies corresponding to the K-edges of transition metals (Cu, Ni, Co etc.). To date, high resolution under these conditions has been achieved only with diced Ge analyzers working at the Cu K-edge. Here, by perfecting each aspect of the fabrication, it is shown that spherically bent Si analyzers can provide the required energy resolution. Such analyzers have been successfully produced and have greatly improved the energy resolution in standard spherically bent analyzers.
Collart
Emilie
E
Laboratoire de Minéralogie-Cristallographie de Paris, Université Paris 6, Université Paris 7, CNRS, IPGP, Case 115, 4 Place Jussieu, 75252 Paris CEDEX 05, France.
Shukla
Abhay
A
Gélébart
Frédéric
F
Morand
Marc
M
Malgrange
Cécile
C
Bardou
Nathalie
N
Madouri
Ali
A
Pelouard
Jean Luc
JL
D004867:Equipment Design; D019544:Equipment Failure Analysis; D012542:Scattering, Radiation; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D014159:Transducers; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods; D014965:X-Rays