Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer.
X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa(2)Cu(3)O(7-delta) (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
Sekioka
Tsuguhisa
T
Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan. sekioka@eng.u-hyogo.ac.jp
Hayashi
Kouichi
K
Matsubara
Eiichiro
E
Takahashi
Yukio
Y
Hayashi
Tetsutaro
T
Terasawa
Mititaka
M
Mitamura
Tohru
T
Iwase
Akihiro
A
Michikami
Osamu
O
D003461:Crystallography / Q000295:instrumentation* / Q000379:methods*; D004553:Electric Conductivity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005063:Europium / Q000032:analysis* / Q000737:chemistry*; D006696:Holography / Q000295:instrumentation* / Q000379:methods*; D008567:Membranes, Artificial; D008968:Molecular Conformation; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*
D008567:Membranes, Artificial; D005063:Europium