title: Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors.
abstract: A dispersion-compensation method to remove the cube-size effect from the resolution function of diced analyzer crystals using a position-sensitive two-dimensional pixel detector is presented. For demonstration, a resolution of 23 meV was achieved with a spectrometer based on a 1 m Rowland circle and a diced Si(555) analyzer crystal in a near-backscattering geometry, with a Bragg angle of 88.5 degrees . In this geometry the spectrometer equipped with a traditional position-insensitive detector provides a resolution of 190 meV. The dispersion-compensation method thus allows a substantial increase in the resolving power without any loss of signal intensity.
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble CEDEX 9, France. huotari@esrf.fr
authors.forename: S
authors.initials: S
authors.lastname: Huotari
authors.forename: Gy
authors.initials: G
authors.lastname: Vankó
authors.forename: F
authors.initials: F
authors.lastname: Albergamo
authors.forename: C
authors.initials: C
authors.lastname: Ponchut
authors.forename: H
authors.initials: H
authors.lastname: Graafsma
authors.forename: C
authors.initials: C
authors.lastname: Henriquet
authors.forename: R
authors.initials: R
authors.lastname: Verbeni
authors.forename: G
authors.initials: G
authors.lastname: Monaco
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D014159:Transducers; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods