title: Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer.
abstract: X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa(2)Cu(3)O(7-delta) (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
authors.affiliation: Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan. sekioka@eng.u-hyogo.ac.jp
authors.forename: Tsuguhisa
authors.initials: T
authors.lastname: Sekioka
authors.forename: Kouichi
authors.initials: K
authors.lastname: Hayashi
authors.forename: Eiichiro
authors.initials: E
authors.lastname: Matsubara
authors.forename: Yukio
authors.initials: Y
authors.lastname: Takahashi
authors.forename: Tetsutaro
authors.initials: T
authors.lastname: Hayashi
authors.forename: Mititaka
authors.initials: M
authors.lastname: Terasawa
authors.forename: Tohru
authors.initials: T
authors.lastname: Mitamura
authors.forename: Akihiro
authors.initials: A
authors.lastname: Iwase
authors.forename: Osamu
authors.initials: O
authors.lastname: Michikami
mesh_terms: D003461:Crystallography / Q000295:instrumentation* / Q000379:methods*; D004553:Electric Conductivity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005063:Europium / Q000032:analysis* / Q000737:chemistry*; D006696:Holography / Q000295:instrumentation* / Q000379:methods*; D008567:Membranes, Artificial; D008968:Molecular Conformation; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*
chemical_list: D008567:Membranes, Artificial; D005063:Europium