Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors.
A dispersion-compensation method to remove the cube-size effect from the resolution function of diced analyzer crystals using a position-sensitive two-dimensional pixel detector is presented. For demonstration, a resolution of 23 meV was achieved with a spectrometer based on a 1 m Rowland circle and a diced Si(555) analyzer crystal in a near-backscattering geometry, with a Bragg angle of 88.5 degrees . In this geometry the spectrometer equipped with a traditional position-insensitive detector provides a resolution of 190 meV. The dispersion-compensation method thus allows a substantial increase in the resolving power without any loss of signal intensity.
Huotari
S
S
European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble CEDEX 9, France. huotari@esrf.fr
Vankó
Gy
G
Albergamo
F
F
Ponchut
C
C
Graafsma
H
H
Henriquet
C
C
Verbeni
R
R
Monaco
G
G
D004867:Equipment Design; D019544:Equipment Failure Analysis; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D014159:Transducers; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods