Nonlinear imaging using annular dark field TEM.
Annular dark field TEM images exhibit a dominant mass-thickness contrast that can be quantified to extract single atom scattering cross sections. On top of this incoherent background, additional lattice fringes appear with a nonlinear information limit of 1.2A at 150 kV. The formation of these fringes is described by coherent nonlinear imaging theory and good agreement is found between experimental and simulated images. Calculations furthermore predict that the use of aberration corrected microscopes will improve the image quality dramatically.
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, USA. sara.bals@ua.ac.be
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Bals
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Kilaas
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Kisielowski