Quantitative chemical derivatization technique in time-of-flight secondary ion mass spectrometry for surface amine groups on plasma-polymerized ethylenediamine film.
A chemical derivatization technique in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been developed to quantify the surface density of amine groups of plasma-polymerized ethylenediamine thin film deposited on a glass surface by inductively coupled plasma chemical vapor deposition. Chemical tags of 4-nitrobenzaldehyde or pentafluorobenzaldehyde were hybridized with the surface amine groups and were detected in TOF-SIMS spectra as characteristic molecular secondary ions. The surface amine density was controlled in a reproducible manner as a function of deposition plasma power and was also quantified using UV-visible spectroscopy. A good linear correlation was observed between the results of TOF-SIMS and UV-visible measurements as a function of plasma power. This shows that the chemical derivatization technique in TOF-SIMS analysis would be useful in quantifying the surface density of specific functional groups that exist on the organic surface.
Department of Physics, Brain Korea 21 Physics Research Division and Institute of Basic Science, Sungkyunkwan University, Suwon 440-746, Korea.
Jinmo
J
Kim
Hyun Kyong
HK
Shon
Donggeun
D
Jung
Dae Won
DW
Moon
Sang Yun
SY
Han
Tae Geol
TG
Lee
D000588:Amines / Q000737:chemistry*; D001547:Benzaldehydes / Q000737:chemistry; D005029:Ethylenediamines / Q000737:chemistry*; D008567:Membranes, Artificial; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D013056:Spectrophotometry, Ultraviolet; D005464:Fluorobenzenes; D005466:Fluorocarbons
D000588:Amines; D001547:Benzaldehydes; D005029:Ethylenediamines; D008567:Membranes, Artificial; C029915:4-nitrobenzaldehyde; C031234:ethylenediamine; C413389:pentafluorobenzaldehyde; D005464:Fluorobenzenes; D005466:Fluorocarbons