Quantitative chemical derivatization technique in time-of-flight secondary ion mass spectrometry for surface amine groups on plasma-polymerized ethylenediamine film.
A chemical derivatization technique in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been developed to quantify the surface density of amine groups of plasma-polymerized ethylenediamine thin film deposited on a glass surface by inductively coupled plasma chemical vapor deposition. Chemical tags of 4-nitrobenzaldehyde or pentafluorobenzaldehyde were hybridized with the surface amine groups and were detected in TOF-SIMS spectra as characteristic molecular secondary ions. The surface amine density was controlled in a reproducible manner as a function of deposition plasma power and was also quantified using UV-visible spectroscopy. A good linear correlation was observed between the results of TOF-SIMS and UV-visible measurements as a function of plasma power. This shows that the chemical derivatization technique in TOF-SIMS analysis would be useful in quantifying the surface density of specific functional groups that exist on the organic surface.
Kim
Jinmo
J
Department of Physics, Brain Korea 21 Physics Research Division and Institute of Basic Science, Sungkyunkwan University, Suwon 440-746, Korea.
Shon
Hyun Kyong
HK
Jung
Donggeun
D
Moon
Dae Won
DW
Han
Sang Yun
SY
Lee
Tae Geol
TG
D000588:Amines / Q000737:chemistry*; D001547:Benzaldehydes / Q000737:chemistry; D005029:Ethylenediamines / Q000737:chemistry*; D008567:Membranes, Artificial; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D013056:Spectrophotometry, Ultraviolet; D005464:Fluorobenzenes; D005466:Fluorocarbons
D000588:Amines; D001547:Benzaldehydes; D005029:Ethylenediamines; D008567:Membranes, Artificial; C029915:4-nitrobenzaldehyde; C031234:ethylenediamine; C413389:pentafluorobenzaldehyde; D005464:Fluorobenzenes; D005466:Fluorocarbons