title: [X-ray fluorescence spectrometric determination of high rhenium content in rhenium-tungsten alloys used in traveling wave tube].
abstract: The matrix effect, spectral overlap and background were investigated for X-ray fluorescence (XRF) spectrometric determination of rhenium content according to the analysis requirement of rhenium-tungsten alloys, a key material used in traveling wave tube. The reason for causing the calibration curve nonlinear was explained theoretically when binary ratio technique of XRF was used. Both theoretical and experimental results show that linear calibration curve can be obtained if the curve is plotted by Re% vs. Re Lalpha X-ray intensity instead of binary ratio technique. The method is rapid and accurate and the results obtained in this work are in good agreement with those of chemical analysis. The method has been successfully applied to product quality control.
authors: Center of Materials Analysis, University of Electronic Science and Technology of China, Chengdu 610054, China.
authors: Sheng-xiang
authors: SX
authors: Bao
authors: Shou-xu
authors: SX
authors: Wang
authors: Li-li
authors: LL
authors: Ma
authors: Deng-hua
authors: DH
authors: Zhao
authors: Rong-kui
authors: RK
authors: Fan
authors: Jian
authors: J
authors: Li
mesh_terms: D000497:Alloys / Q000032:analysis* / Q000737:chemistry / Q000592:standards; D055664:Electrochemical Techniques / Q000295:instrumentation; D011786:Quality Control; D015203:Reproducibility of Results; D012211:Rhenium / Q000032:analysis* / Q000737:chemistry; D013052:Spectrometry, X-Ray Emission; D014414:Tungsten / Q000737:chemistry*
chemical_list: D000497:Alloys; D012211:Rhenium; D014414:Tungsten