title: Perpendicular magnetization in self-assembled films of citrate-capped gamma-Fe2O3 nanocrystals on Si(100) surfaces.
abstract: gamma-Fe2O3 nanocrystals capped with citrate and octylamine have been chemically prepared. The octylamine-capped nanocrystals exhibit a tendency to form ordered lattices. Films of nanocrystals of varying thickness (454, 720, and 1400 microg/cm2 in the case of citrate-capped nanocrystals and 300 microg/cm2 in the case of octylamine-capped nanocrystals) have been prepared on Si(100) substrates by drop casting and have been characterized by X-ray diffraction, scanning electron microscopy, and atomic force microscopy. Magnetic measurements have been carried out on the films as well as on nanocrystal powders. The films of citrate-capped gamma-Fe2O3 nanocrystals exhibit enhanced perpendicular magnetization, with the anisotropy depending on the film thickness.
authors: Chemistry and Physics of Materials Unit, Jawaharlal Nehru Center for Advanced Scientific Research, Jakkur, Bangalore-560 064, India.
authors: P John
authors: PJ
authors: Thomas
authors: Michael
authors: M
authors: Rajamathi
authors: P V
authors: PV
authors: Vanitha
authors: G U
authors: GU
authors: Kulkarni
authors: C N R
authors: CN
authors: Rao
mesh_terms: D000588:Amines / Q000737:chemistry; D016880:Anisotropy; D005290:Ferric Compounds / Q000737:chemistry*; D008280:Magnetics; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D046529:Microscopy, Electron, Transmission; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D012822:Silicon Dioxide / Q000737:chemistry; D014961:X-Ray Diffraction
chemical_list: D000588:Amines; D005290:Ferric Compounds; C000499:ferric oxide; D012822:Silicon Dioxide; C008699:octylamine; D012825:Silicon