title: Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces.
abstract: We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.
authors: Intense Pulsed Neutron Source, Argonne National Laboratory, IL 60439, USA. jlal@anl.gov
authors: Xuesong
authors: X
authors: Hu
authors: Xuesong
authors: X
authors: Jiao
authors: Suresh
authors: S
authors: Narayanan
authors: Zhang
authors: Z
authors: Jiang
authors: Sunil
authors: S
authors: K Sinha
authors: L B
authors: LB
authors: Lurio
authors: Jyotsana
authors: J
authors: Lal
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D008956:Models, Chemical; D008958:Models, Molecular; D011137:Polystyrenes / Q000032:analysis / Q000737:chemistry*; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation; D013499:Surface Properties; D014961:X-Ray Diffraction / Q000379:methods*
chemical_list: D011137:Polystyrenes