Image of a straight edge in confocal self-interference microscopy.
An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10-90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10-90% width.
Kang
DongKyun
D
Nano Opto Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Gusung-dong, Yusung-gu, Daejeon, South Korea. godogo@kaist.ac.kr
Gweon
DaeGab
D
D000465:Algorithms; D001718:Birefringence; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D018613:Microscopy, Confocal / Q000379:methods*; D012031:Refractometry / Q000379:methods*