title: Environmental trace-element analysis using a benchtop total reflection X-ray fluorescence spectrometer.
abstract: Total reflection X-ray fluorescence (TXRF) analysis is an established technique for trace-element analysis in various types of samples. Though expensive large-scale systems restricted the applications in the past, in this study the capability of a benchtop system for trace elemental analysis is reported. The suitability of this system for the mobile on-site analysis of heavy metal contaminated soils and sediments is reported as well as the possibilities and restrictions of TXRF for additional applications, including trace-element analysis of water, glass and biological samples.
authors.affiliation: Röntec AG, Schwarzschildstrasse 12, D-12489 Berlin, Germany.
authors.forename: Hagen
authors.initials: H
authors.lastname: Stosnach
mesh_terms: D004785:Environmental Pollutants / Q000032:analysis*; D019015:Geologic Sediments / Q000737:chemistry; D012987:Soil / Q000032:analysis; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*; D014131:Trace Elements / Q000032:analysis*; D014867:Water / Q000737:chemistry
chemical_list: D004785:Environmental Pollutants; D012987:Soil; D014131:Trace Elements; D014867:Water