title: Self-referenced prism deflection measurement schemes with microradian precision.
abstract: We have demonstrated several inexpensive methods that can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, where various reversals are used to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our laboratory to characterize parallel-plate beam splitters, penta prisms, right-angle prisms, and corner cube reflectors using only components typically available in an optics laboratory.
authors.affiliation: Department of Physics and Astronomy, Brigham Young University, Provo, Utah 84602, USA.
authors.forename: Rebecca
authors.initials: R
authors.lastname: Olson
authors.forename: Justin
authors.initials: J
authors.lastname: Paul
authors.forename: Scott
authors.initials: S
authors.lastname: Bergeson
authors.forename: Dallin S
authors.initials: DS
authors.lastname: Durfee