title: Effect of energy dependence of primary beam divergence on the X-ray standing wave characterization of layered materials.
abstract: Incident primary beam divergence is a source of systematic error in X-ray standing wave (XSW) characterization of single and multilayer thin films. Primary beam divergence significantly alters the XSW profile of a layered material and can lead to large errors when used with higher excitation energies. The present study suggests that when one uses Mo-Kalpha excitation, the primary beam divergence should be in range of 0.005(0). On the other hand, in the case of Cu-Kalpha excitation, primary beam divergence can be relaxed up to 0.01(0).
authors.affiliation: Synchrotron Utilization Division, Centre for Advanced Technology, Indore-452013, India. mktiwari@cat.ernet.in
authors.forename: M K
authors.initials: MK
authors.lastname: Tiwari
authors.forename: S R
authors.initials: SR
authors.lastname: Naik
authors.forename: G S
authors.initials: GS
authors.lastname: Lodha
authors.forename: R V
authors.initials: RV
authors.lastname: Nandedkar