Depth profiling with modified dc-Grimm and rf-Grimm-type glow discharges operated with high gas flow rates and coupled to a high-resolution mass spectrometer.
The improved analytical capability of direct-current (dc) and radiofrequency (rf) "fast flow" glow discharges coupled to a sector field mass spectrometer (GD-SFMS) are presented. In particular, the effect of GD chamber design has been studied to obtain suitable crater shapes for depth-profile analysis of solid samples while maintaining the high sensitivity and stability of this source. In this study it was observed that the distance between the sample surface and the end of the flow tube is critical and so careful optimisation is needed. Under optimum conditions plane crater profiles, with high ion-signal sensitivity and sufficient stability, were obtained. The capability to determine qualitative and semi-quantitative depth profiles is presented here using, as model, a coated sample of certified thickness. Finally, the depth resolution achieved for qualitative depth profiles obtained by rf-GD-(SF)MS is compared with that for the well-established rf-GD optical emission spectroscopy (OES) technique.
Pisonero
Jorge
J
Department of Physics, University of Oviedo, c/Calvo Sotelo s/n, 33007 Oviedo, Spain.
Feldmann
Ingo
I
Bordel
Nerea
N
Sanz-Medel
Alfredo
A
Jakubowski
Norbert
N
D055598:Chemical Phenomena; D002627:Chemistry, Physical; D004867:Equipment Design; D013058:Mass Spectrometry / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D013059:Spectrum Analysis, Raman / Q000379:methods; D013499:Surface Properties