title: Gradient chemical micro patterns: a reference substrate for surface nanometrology.
abstract: We present fabrication routes for a new type of surface specimen that exhibits a micro pattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micro pattern to be related to well-established surface characterization data, such as contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically sensitive scanning probe microscopy techniques and a platform for the high-throughput analysis of polymer thin film behavior.
authors.affiliation: Polymers Division and Materials and Construction Research Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
authors.forename: Duangrut
authors.initials: D
authors.lastname: Julthongpiput
authors.forename: Michael J
authors.initials: MJ
authors.lastname: Fasolka
authors.forename: Wenhua
authors.initials: W
authors.lastname: Zhang
authors.forename: Tinh
authors.initials: T
authors.lastname: Nguyen
authors.forename: Eric J
authors.initials: EJ
authors.lastname: Amis
mesh_terms: D008422:Materials Testing / Q000379:methods* / Q000592:standards*; D020527:Microscopy, Scanning Probe / Q000379:methods* / Q000592:standards*; D049329:Nanostructures / Q000032:analysis* / Q000737:chemistry / Q000592:standards; D036103:Nanotechnology / Q000379:methods* / Q000592:standards*; D012015:Reference Standards; D013499:Surface Properties