title: Complete characterization of periodic optical sources by use of sampled test-plus-reference interferometry.
abstract: An interferometric technique measuring the time-dependent electric field of a periodic optical source that uses samples of its interference with a reference source of short optical pulses is presented. Compared with other test-plus-reference techniques such as spectral interferometry and Fourier-transform spectroscopy, the technique is applicable when the signal under test and the reference signal do not originate from the same source. It is highly sensitive and allows the direct real-time characterization of optical sources and the extraction of a coherent periodic signal in an incoherent background.
authors.affiliation: Bell Laboratories-Lucent Technologies, 791 Holmdel-Keyport Road, Holmdel, New Jersey 07733, USA. dorrer@lucent.com
authors.forename: Christophe
authors.initials: C
authors.lastname: Dorrer