title: A new paradigm to extend diffraction measurements beyond the megabar regime.
abstract: The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.
authors.affiliation: Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, MS6R2100, Berkeley, CA 94720-8226, USA. smclark@lbl.gov
authors.forename: S M
authors.initials: SM
authors.lastname: Clark
authors.forename: R
authors.initials: R
authors.lastname: Jeanloz