A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM.
A simple and practical method for minimizing non-linear image contrast in spherical aberration-corrected (C(S)-corrected) high-resolution transmission electron microscopy is presented. The effectiveness of the method is considered from the viewpoints of theoretical formulations and image simulations including second-order imaging effects. The method is one of the advantages of C(S)-correction and applied to high-resolution images down to 0.1 nm. The dynamical diffraction effect is carefully evaluated, which shows that the phase deviation of diffracted waves from pi/2 violates the present method in thicker crystals over approximately 10 nm.
Yamasaki
Jun
J
EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan.
Kawai
Tomoyuki
T
Tanaka
Nobuo
N