title: Performance of a dispersion-compensating scanning X-ray spectrometer for Compton profile measurements.
abstract: A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses approximately 90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high-energy X-rays, the enhancement of the counting rate is spectacular for heavy-element materials.
authors.affiliation: Synchrotron Radiation Facility (ESRF), BP 220, 38043 Grenoble CEDEX 9, France. hiraoka@spring8.or.jp
authors.forename: N
authors.initials: N
authors.lastname: Hiraoka
authors.forename: T
authors.initials: T
authors.lastname: Buslaps
authors.forename: V
authors.initials: V
authors.lastname: Honkimäki
authors.forename: P
authors.initials: P
authors.lastname: Suortti