Quantitative high-pressure pair distribution function analysis.
The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high-brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected up to about 30 GPa in either a large-volume high-pressure apparatus or diamond anvil cell. In those cases where the total elastic scattering is of interest, as it is in the case of nano-crystalline and glassy materials, technical developments, including the use of focused high-energy X-rays (>80 keV), are advantageous. Recently completed experiments on nano-crystalline materials at the 1-ID beamline at the Advanced Photon Source suggest that quantitative data, suitable for pair distribution function analysis, can be obtained.
Parise
John B
JB
Center for Environmental Molecular Sciences, CEMS, Stony Brook, NY 11794, USA. john.parise@stonybrook.edu
Antao
Sytle M
SM
Michel
F Marc
FM
Martin
C David
CD
Chupas
Peter J
PJ
Shastri
Sarvjit D
SD
Lee
Peter L
PL