title: Precise measurement of third-order spherical aberration using low-order zone-axis Ronchigrams.
abstract: A method for the measurement of third-order spherical aberration coefficients (C(s)) is suggested, using low-order zone-axis Ronchigrams of a crystalline material. The validity of the method is confirmed using simulated and experimental Ronchigrams taken with various probe-forming lens configurations. The precision of the measured C(s) value is drastically improved compared with that obtained from the power spectrum-analysis method. In addition, a method for roughly estimating defocus values is presented.
authors.affiliation: Department of Physics, Tokyo University of Science, 1-3 Kagurazaka/Shinjuku-ku, Tokyo 162-8601, Japan. yamazaki@rs.kagu.tus.ac.jp
authors.forename: Takashi
authors.initials: T
authors.lastname: Yamazaki
authors.forename: Yasutoshi
authors.initials: Y
authors.lastname: Kotaka
authors.forename: Yoshio
authors.initials: Y
authors.lastname: Kikuchi
authors.forename: Kazuto
authors.initials: K
authors.lastname: Watanabe