title: Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
abstract: Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized convex surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.
authors.affiliation: Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan. yhayashi@spring8.or.jp
authors.forename: Yujiro
authors.initials: Y
authors.lastname: Hayashi
authors.forename: Noboru
authors.initials: N
authors.lastname: Tsukuda
authors.forename: Eiichi
authors.initials: E
authors.lastname: Kuramoto
authors.forename: Yoshihito
authors.initials: Y
authors.lastname: Tanaka
authors.forename: Tetsuya
authors.initials: T
authors.lastname: Ishikawa