title: Deconvolution of overlapped peaks based on the exponentially modified Gaussian model in comprehensive two-dimensional gas chromatography.
abstract: Comprehensive two-dimensional gas chromatography (GC x GC) has attracted much attention for the analysis of complex samples. Even with a large peak capacity in GC x GC, peak overlapping is often met. In this paper, a new method was developed to resolve overlapped peaks based on the mass conservation and the exponentially modified Gaussian (EMG) model. Linear relationships between the calculated sigma, tau of primary peaks with the corresponding retention time (tR) were obtained, and the correlation coefficients were over 0.99. Based on such relationships, the elution profile of each compound in overlapped peaks could be simulated, even for the peak never separated on the second-dimension. The proposed method has proven to offer more accurate peak area than the general data processing method.
authors.affiliation: National Chromatographic R&A Center, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.
authors.forename: Hongwei
authors.initials: H
authors.lastname: Kong
authors.forename: Fen
authors.initials: F
authors.lastname: Ye
authors.forename: Xin
authors.initials: X
authors.lastname: Lu
authors.forename: Lei
authors.initials: L
authors.lastname: Guo
authors.forename: Jing
authors.initials: J
authors.lastname: Tian
authors.forename: Guowang
authors.initials: G
authors.lastname: Xu
mesh_terms: D002849:Chromatography, Gas / Q000379:methods*; D008962:Models, Theoretical