title: Quantitative high-pressure pair distribution function analysis.
abstract: The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high-brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected up to about 30 GPa in either a large-volume high-pressure apparatus or diamond anvil cell. In those cases where the total elastic scattering is of interest, as it is in the case of nano-crystalline and glassy materials, technical developments, including the use of focused high-energy X-rays (>80 keV), are advantageous. Recently completed experiments on nano-crystalline materials at the 1-ID beamline at the Advanced Photon Source suggest that quantitative data, suitable for pair distribution function analysis, can be obtained.
authors.affiliation: Center for Environmental Molecular Sciences, CEMS, Stony Brook, NY 11794, USA. john.parise@stonybrook.edu
authors.forename: John B
authors.initials: JB
authors.lastname: Parise
authors.forename: Sytle M
authors.initials: SM
authors.lastname: Antao
authors.forename: F Marc
authors.initials: FM
authors.lastname: Michel
authors.forename: C David
authors.initials: CD
authors.lastname: Martin
authors.forename: Peter J
authors.initials: PJ
authors.lastname: Chupas
authors.forename: Sarvjit D
authors.initials: SD
authors.lastname: Shastri
authors.forename: Peter L
authors.initials: PL
authors.lastname: Lee