title: Atomic structure of a thin silica film on a Mo(112) substrate: a two-dimensional network of SiO4 tetrahedra.
abstract: The structure of a thin single crystalline SiO(2) film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO(4)] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.
authors.affiliation: Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany.
authors.forename: J
authors.initials: J
authors.lastname: Weissenrieder
authors.forename: S
authors.initials: S
authors.lastname: Kaya
authors.forename: J-L
authors.initials: JL
authors.lastname: Lu
authors.forename: H-J
authors.initials: HJ
authors.lastname: Gao
authors.forename: S
authors.initials: S
authors.lastname: Shaikhutdinov
authors.forename: H-J
authors.initials: HJ
authors.lastname: Freund
authors.forename: M
authors.initials: M
authors.lastname: Sierka
authors.forename: T K
authors.initials: TK
authors.lastname: Todorova
authors.forename: J
authors.initials: J
authors.lastname: Sauer