title: Local infrared microspectroscopy with subwavelength spatial resolution with an atomic force microscope tip used as a photothermal sensor.
abstract: We describe a new method of infrared microspectroscopy. It is intended for performing chemical mapping of various objects with subwavelength lateral resolution by using the infrared vibrational signature characterizing different molecular species. We use the photothermal expansion effect, detected by an atomic force microscope tip, probing the local transient deformation induced by an infrared pulsed laser tuned at a sample absorbing wavelength. We show that this new tool opens the way for measuring and identifying spectroscopic contrasts not accessible by far-field or near-field optical methods and with a subwavelength lateral resolution.
authors.affiliation: Centre Laser Infrarouge Orsay, CLIO/LURE, Bâtiment 209D, Université Paris-Sud, BP34, 91898 Orsay, France.
authors.forename: A
authors.initials: A
authors.lastname: Dazzi
authors.forename: R
authors.initials: R
authors.lastname: Prazeres
authors.forename: F
authors.initials: F
authors.lastname: Glotin
authors.forename: J M
authors.initials: JM
authors.lastname: Ortega
mesh_terms: D004926:Escherichia coli / Q000737:chemistry* / Q000648:ultrastructure*; D007089:Image Enhancement / Q000295:instrumentation / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D013055:Spectrophotometry, Infrared / Q000295:instrumentation / Q000379:methods*; D013817:Thermography / Q000295:instrumentation / Q000379:methods*; D014159:Transducers