Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone.
The missing data problem, i.e., the intensities at the center of diffraction patterns cannot be experimentally measured, is currently a major limitation for wider applications of coherent diffraction microscopy. We report here that, when the missing data are confined within the centrospeckle, the missing data problem can be reliably solved. With an improved instrument, we recorded 27 oversampled diffraction patterns at various orientations from a GaN quantum dot nanoparticle and performed quantitative image reconstruction from the diffraction intensities alone. This work in principle clears the way for single-shot imaging experiments using x-ray free electron lasers.
Miao
Jianwei
J
Department of Physics and Astronomy and CNSI, University of California, Los Angeles, California 90095-1547, USA.
Nishino
Yoshinori
Y
Kohmura
Yoshiki
Y
Johnson
Bart
B
Song
Changyong
C
Risbud
Subhash H
SH
Ishikawa
Tetsuya
T