Atomic structure of a thin silica film on a Mo(112) substrate: a two-dimensional network of SiO4 tetrahedra.
The structure of a thin single crystalline SiO(2) film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO(4)] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.
Weissenrieder
J
J
Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany.
Kaya
S
S
Lu
J-L
JL
Gao
H-J
HJ
Shaikhutdinov
S
S
Freund
H-J
HJ
Sierka
M
M
Todorova
T K
TK
Sauer
J
J