title: In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si.
abstract: Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.
authors.affiliation: Department of Physics, Washington University, St. Louis, Missouri 63130, USA.
authors.forename: T H
authors.initials: TH
authors.lastname: Kim
authors.forename: G W
authors.initials: GW
authors.lastname: Lee
authors.forename: B
authors.initials: B
authors.lastname: Sieve
authors.forename: A K
authors.initials: AK
authors.lastname: Gangopadhyay
authors.forename: R W
authors.initials: RW
authors.lastname: Hyers
authors.forename: T J
authors.initials: TJ
authors.lastname: Rathz
authors.forename: J R
authors.initials: JR
authors.lastname: Rogers
authors.forename: D S
authors.initials: DS
authors.lastname: Robinson
authors.forename: K F
authors.initials: KF
authors.lastname: Kelton
authors.forename: A I
authors.initials: AI
authors.lastname: Goldman