Reciprocal space mapping and single-crystal scattering rods.
Reciprocal space mapping using a linear gas detector in combination with a matching Soller collimator has been applied to map scattering rods of well oriented organic microcrystals grown on a solid surface. Formulae are provided to correct image distortions in angular space and to determine the required oscillation range, in order to measure properly integrated scattering intensities.
Smilgies
Detlef M
DM
CHESS Center, Cornell University, Ithaca, NY 14853, USA. dms79@cornell.edu
Blasini
Daniel R
DR
Hotta
Shu
S
Yanagi
Hisao
H
D003460:Crystallization / Q000379:methods; D018360:Crystallography, X-Ray / Q000295:instrumentation*; D013876:Thiophenes / Q000737:chemistry*
D013876:Thiophenes