title: Reciprocal space mapping and single-crystal scattering rods.
abstract: Reciprocal space mapping using a linear gas detector in combination with a matching Soller collimator has been applied to map scattering rods of well oriented organic microcrystals grown on a solid surface. Formulae are provided to correct image distortions in angular space and to determine the required oscillation range, in order to measure properly integrated scattering intensities.
authors.affiliation: CHESS Center, Cornell University, Ithaca, NY 14853, USA. dms79@cornell.edu
authors.forename: Detlef M
authors.initials: DM
authors.lastname: Smilgies
authors.forename: Daniel R
authors.initials: DR
authors.lastname: Blasini
authors.forename: Shu
authors.initials: S
authors.lastname: Hotta
authors.forename: Hisao
authors.initials: H
authors.lastname: Yanagi
mesh_terms: D003460:Crystallization / Q000379:methods; D018360:Crystallography, X-Ray / Q000295:instrumentation*; D013876:Thiophenes / Q000737:chemistry*
chemical_list: D013876:Thiophenes