Pulsed field-ionization photoelectron-photoion coincidence study of the process N2+hnu-->N++N+e-: bond dissociation energies of N2 and N2+.
We have examined the dissociative photoionization reaction N2+hnu-->N++N+e- near its threshold using the pulsed field-ionization photoelectron-photoion coincidence (PFI-PEPICO) time-of-flight (TOF) method. By examining the kinetic-energy release based on the simulation of the N+ PFI-PEPICO TOF peak profile as a function of vacuum ultraviolet photon energy and by analyzing the breakdown curves of N+ and N2+, we have determined the 0-K threshold or appearance energy (AE) of this reaction to be 24.2884+/-0.0010 eV. Using this 0-K AE, together with known ionization energies of N and N2, results in more precise values for the 0-K bond dissociation energies of N-N (9.7543+/-0.0010 eV) and N-N+ (8.7076+/-0.0010 eV) and the 0-K heats of formation for N (112.469+/-0.012 kcal/mol) and N+ (447.634+/-0.012 kcal/mol).
Tang
Xiaonan
X
Department of Chemistry, University of California, Davis, California 95616, USA.
Hou
Yu
Y
Ng
C Y
CY
Ruscic
Branko
B