Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences.
In this paper magnetic fields intensity of C60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 mW/cm2. Based on 200 measurement data average value of difference between magnetic intensity of C60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively.
Koruga
Djuro
D
Molecular Machines Research Center, University of Belgrade, Serbia & Montenegro.
Nikolić
Aleksandra
A
Mihajlović
Spomenko
S
Matija
Lidija
L
D003460:Crystallization / Q000379:methods; D003624:Darkness; D004307:Dose-Response Relationship, Radiation; D018534:Earth, Planet; D004574:Electromagnetic Fields; D037741:Fullerenes / Q000032:analysis / Q000737:chemistry* / Q000528:radiation effects*; D008027:Light; D008280:Magnetics; D008422:Materials Testing; D008567:Membranes, Artificial; D049329:Nanostructures / Q000032:analysis / Q000737:chemistry* / Q000528:radiation effects*; D036103:Nanotechnology / Q000379:methods*; D010316:Particle Size; D011829:Radiation Dosage; D011874:Radiometry; D013499:Surface Properties
D037741:Fullerenes; D008567:Membranes, Artificial