title: Fabrication and analysis of spatially uniform field electrokinetic flow devices: theory and experiment.
abstract: A uniform-field design approach can improve the performance of microanalytical, chip-based devices for a number of applications, including separations and sample preparation. The faceted prism paradigm allows the design of microfluidic devices possessing spatially uniform fields in electrokinetically driven flows. We present the first quantitative study of the velocity fields obtained using faceted interfaces between deep and shallow channel sections. Electrokinetic flows were generated in a series of wet-etch fabricated microfluidic channels. The resulting velocity fields were analyzed by particle image velocimetry and compared with simulations of the two-dimensional Laplace equation using both the designed channel geometry and the as-fabricated channel geometry. This analysis found localized differences between the designed and observed flow fields that were directly attributable to the limitations of isotropic substrate etching. Simulations using the as-fabricated channel geometry reproduced the experimental electrokinetic velocity field, quantitatively accounting for speed field variations due to the limits of the fabrication method. The electrokinetic speed fields were also compared to corresponding pressure-driven speed fields.
authors.affiliation: Sandia National Laboratories, Livermore, California 94551, USA. ajskula@sandia.gov
authors.forename: Andrew J
authors.initials: AJ
authors.lastname: Skulan
authors.forename: Louise M
authors.initials: LM
authors.lastname: Barrett
authors.forename: Anup K
authors.initials: AK
authors.lastname: Singh
authors.forename: Eric B
authors.initials: EB
authors.lastname: Cummings
authors.forename: Gregory J
authors.initials: GJ
authors.lastname: Fiechtner
mesh_terms: D004563:Electrochemistry / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design / Q000379:methods; D046210:Microfluidic Analytical Techniques / Q000295:instrumentation* / Q000379:methods; D013499:Surface Properties