Ultra-small-angle X-ray scattering from dislocation structures.
Ultra-small-angle X-ray scattering data were obtained from deformed single-crystal aluminium samples. These data are consistent with recent theoretical predictions of scattering from dislocation walls, allowing quantitative microstructural parameters to be extracted.
Long
G G
GG
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. gglong@aps.anl.gov
Levine
L E
LE