title: Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences.
abstract: In this paper magnetic fields intensity of C60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 mW/cm2. Based on 200 measurement data average value of difference between magnetic intensity of C60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively.
authors.affiliation: Molecular Machines Research Center, University of Belgrade, Serbia & Montenegro.
authors.forename: Djuro
authors.initials: D
authors.lastname: Koruga
authors.forename: Aleksandra
authors.initials: A
authors.lastname: Nikolić
authors.forename: Spomenko
authors.initials: S
authors.lastname: Mihajlović
authors.forename: Lidija
authors.initials: L
authors.lastname: Matija
mesh_terms: D003460:Crystallization / Q000379:methods; D003624:Darkness; D004307:Dose-Response Relationship, Radiation; D018534:Earth, Planet; D004574:Electromagnetic Fields; D037741:Fullerenes / Q000032:analysis / Q000737:chemistry* / Q000528:radiation effects*; D008027:Light; D008280:Magnetics; D008422:Materials Testing; D008567:Membranes, Artificial; D049329:Nanostructures / Q000032:analysis / Q000737:chemistry* / Q000528:radiation effects*; D036103:Nanotechnology / Q000379:methods*; D010316:Particle Size; D011829:Radiation Dosage; D011874:Radiometry; D013499:Surface Properties
chemical_list: D037741:Fullerenes; D008567:Membranes, Artificial