title: Ultra-small-angle X-ray scattering from dislocation structures.
abstract: Ultra-small-angle X-ray scattering data were obtained from deformed single-crystal aluminium samples. These data are consistent with recent theoretical predictions of scattering from dislocation walls, allowing quantitative microstructural parameters to be extracted.
authors.affiliation: Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. gglong@aps.anl.gov
authors.forename: G G
authors.initials: GG
authors.lastname: Long
authors.forename: L E
authors.initials: LE
authors.lastname: Levine