High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths.
It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 x 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.
Chiang
Hai-Pang
HP
Institute of Optoelectronic Sciences, National Taiwan Ocean University, Keelung, Taiwan. hpchiang@mail.ntou.edu.tw
Lin
Jing-Lun
JL
Chang
Railing
R
Su
Sheng-Yu
SY
Leung
Pui Tak
PT
D000465:Algorithms; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D016247:Information Storage and Retrieval / Q000379:methods; D007368:Interferometry / Q000295:instrumentation / Q000379:methods*; D009038:Motion; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D020349:Surface Plasmon Resonance / Q000295:instrumentation / Q000379:methods*