title: High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths.
abstract: It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 x 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.
authors.affiliation: Institute of Optoelectronic Sciences, National Taiwan Ocean University, Keelung, Taiwan. hpchiang@mail.ntou.edu.tw
authors.forename: Hai-Pang
authors.initials: HP
authors.lastname: Chiang
authors.forename: Jing-Lun
authors.initials: JL
authors.lastname: Lin
authors.forename: Railing
authors.initials: R
authors.lastname: Chang
authors.forename: Sheng-Yu
authors.initials: SY
authors.lastname: Su
authors.forename: Pui Tak
authors.initials: PT
authors.lastname: Leung
mesh_terms: D000465:Algorithms; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D016247:Information Storage and Retrieval / Q000379:methods; D007368:Interferometry / Q000295:instrumentation / Q000379:methods*; D009038:Motion; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D020349:Surface Plasmon Resonance / Q000295:instrumentation / Q000379:methods*