title: Observation of amplitude and phase in ridge and photonic crystal waveguides operating at 1.55 microm by use of heterodyne scanning near-field optical microscopy.
abstract: We apply heterodyne scanning near-field optical microscopy (SNOM) to observe with subwavelength resolution the amplitude and phase of optical fields propagating in several microfabricated waveguide devices operating around the 1.55 microm wavelength. Good agreement between the SNOM measurements and predicted optical mode propagation characteristics in standard ridge waveguides demonstrates the validity of the method. In situ observation of the subwavelength-scale distribution and propagation of optical fields in straight and 90 degrees bend photonic crystal waveguides facilitates a more detailed understanding of the optical performance characteristics of these devices and illustrates the usefulness of the technique for investigating nanostructured photonic devices.
authors.affiliation: Institute of Microtechnology, University of Neuchâtel, Rue A.-L. Breguet 2, 2000 Neuchâtel, Switzerland. piero.tortora@unine.ch
authors.forename: P
authors.initials: P
authors.lastname: Tortora
authors.forename: M
authors.initials: M
authors.lastname: Abashin
authors.forename: I
authors.initials: I
authors.lastname: Märki
authors.forename: W
authors.initials: W
authors.lastname: Nakagawa
authors.forename: L
authors.initials: L
authors.lastname: Vaccaro
authors.forename: M
authors.initials: M
authors.lastname: Salt
authors.forename: H P
authors.initials: HP
authors.lastname: Herzig
authors.forename: U
authors.initials: U
authors.lastname: Levy
authors.forename: Y
authors.initials: Y
authors.lastname: Fainman
mesh_terms: D003460:Crystallization / Q000379:methods*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000379:methods*; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods*; D017785:Photons