title: Study of surface forces dependence on pH by atomic force microscopy.
abstract: We used an atomic force microscope to investigate silicon nitride tip interactions with various materials (copper, nickel, silicon carbide) as a function of pH. The electrolyte used was 10(-3) M NaCl and the interactions observed through force versus distance curves (attraction or repulsion) depended on the pH value. Interaction forces calculation was derived from force versus distance curve data and the results are discussed in terms of electrostatic interactions using Zeta potential theory.
authors.affiliation: Laboratoire de Microanalyse des Surfaces, ENSMM, 26, chemin de l'épitaphe, Besançon Cedex, 25030, France. Jamal.Takadoum@ens2m.fr
authors.forename: J
authors.initials: J
authors.lastname: Gavoille
authors.forename: J
authors.initials: J
authors.lastname: Takadoum