title: Read-noise characterization of focal plane array detectors via mean-variance analysis.
abstract: Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.
authors.affiliation: Department of Chemistry, University of Arizona, Tucson, AZ 86721, USA.
authors.forename: R P
authors.initials: RP
authors.lastname: Sperline
authors.forename: A K
authors.initials: AK
authors.lastname: Knight
authors.forename: C A
authors.initials: CA
authors.lastname: Gresham
authors.forename: D W
authors.initials: DW
authors.lastname: Koppenaal
authors.forename: G M
authors.initials: GM
authors.lastname: Hieftje
authors.forename: M B
authors.initials: MB
authors.lastname: Denton
mesh_terms: D000465:Algorithms; D000704:Analysis of Variance; D016477:Artifacts; D003198:Computer Simulation; D003627:Data Interpretation, Statistical; D019544:Equipment Failure Analysis / Q000379:methods*; D015233:Models, Statistical; D012666:Semiconductors; D013057:Spectrum Analysis / Q000295:instrumentation* / Q000379:methods; D013269:Stochastic Processes; D014159:Transducers