title: Analysis of organic films and interfacial layers by infrared spectroscopic ellipsometry.
authors.affiliation: ISAS-Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany.
authors.forename: K
authors.initials: K
authors.lastname: Hinrichs
authors.forename: M
authors.initials: M
authors.lastname: Gensch
authors.forename: N
authors.initials: N
authors.lastname: Esser
mesh_terms: D000465:Algorithms; D008567:Membranes, Artificial; D009930:Organic Chemicals / Q000032:analysis* / Q000737:chemistry*; D012031:Refractometry / Q000379:methods*; D013055:Spectrophotometry, Infrared / Q000379:methods*
chemical_list: D008567:Membranes, Artificial; D009930:Organic Chemicals