title: Reduction of tip-sample contact using dielectrophoretic force scanning probe microscopy.
abstract: Dielectrophoretic force microscopy is shown to allow for facile noncontact imaging of systems in aqueous media. Electrokinetic tip-sample forces were predicted from topography measurements of an interface and compared with experimental images. Correlation function and power spectral density analyses indicated that image feedback was maintained without mechanical contact using moderate potentials (e.g., approximately 18 nm off the surface for a 7-Vpp, 100-kHz waveform). The applied dielectrophoretic force and the corresponding increase in effective tip radius were predictably adjusted by changing the peak potential.
authors.affiliation: Department of Chemistry, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: Al M
authors.initials: AM
authors.lastname: Hilton
authors.forename: Brian P
authors.initials: BP
authors.lastname: Lynch
authors.forename: Garth J
authors.initials: GJ
authors.lastname: Simpson
mesh_terms: D008433:Mathematics; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D055672:Static Electricity