A novel dual-axis iterative algorithm for electron tomography.
A new algorithm for computing electron microscopy tomograms which combines iterative methods with dual-axis geometry is presented. Initial modelling using test data shows several improvements over both the weighted back-projection and simultaneous iterative reconstruction technique methods, with increased stability and tomogram fidelity under high-noise conditions. Preliminary experimental dual-axis reconstructions confirm the viability of the new algorithm.
Tong
Jenna
J
Department of Materials Science and Metallurgy, University of Cambridge, UK.
Arslan
Ilke
I
Midgley
Paul
P
D000465:Algorithms; D005583:Fourier Analysis; D021621:Imaging, Three-Dimensional / Q000379:methods; D008854:Microscopy, Electron / Q000379:methods*; D014057:Tomography, X-Ray Computed / Q000379:methods*