title: 115 kHz tuning repetition rate ultrahigh-speed wavelength-swept semiconductor laser.
abstract: We demonstrate an ultrahigh-speed wavelength-swept semiconductor laser using a polygon-based wavelength scanning filter. With a polygon rotational speed of 900 revolutions per second, a continuous wavelength tuning rate of 9200 nm/ms and a tuning repetition rate of 115 kHz were achieved. The wavelength tuning range of the laser was 80 nm centered at 1325 nm, and the average polarized output power was 23 mW.
authors.affiliation: Harvard Medical School and Wellman Center for Photomedicine, Massachusetts General Hospital, Boston 02114, USA. woh1@partners.org
authors.forename: W Y
authors.initials: WY
authors.lastname: Oh
authors.forename: S H
authors.initials: SH
authors.lastname: Yun
authors.forename: G J
authors.initials: GJ
authors.lastname: Tearney
authors.forename: B E
authors.initials: BE
authors.lastname: Bouma
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods; D007834:Lasers; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods; D010507:Periodicity; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity