Optical vector network analyzer for single-scan measurements of loss, group delay, and polarization mode dispersion.
We present a method for measuring the complete linear response, including amplitude, phase, and polarization, of a fiber-optic component or assembly that requires only a single scan of a tunable laser source. The method employs polarization-diverse swept-wavelength interferometry to measure the matrix transfer function of a device under test. We outline the theory of operation to establish how the transfer function is obtained. We demonstrate the enhanced accuracy, precision, and dynamic range of the technique through measurements of several components.
Gifford
Dawn K
DK
Luna Technologies, 2020 Kraft Drive, Suite 2000, Blacksburg, Virginia 24060, USA. giffordd@lunatechnologies.com
Soller
Brian J
BJ
Wolfe
Matthew S
MS
Froggatt
Mark E
ME