Polarization relaxation induced by a depolarization field in ultrathin ferroelectric capacitors.
Time-dependent polarization relaxation behavior induced by a depolarization field E(d) was investigated on high-quality ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors. The E(d) values were determined experimentally from an applied external field to stop the net polarization relaxation. These values agree with those from the electrostatic calculations, demonstrating that a large E(d) inside the ultrathin ferroelectric layer could cause severe polarization relaxation. For numerous ferroelectric devices of capacitor configuration, this effect will set a stricter size limit than the critical thickness issue.
Kim
D J
DJ
ReCOE and School of Physics, Seoul National University, Seoul 151-747, Korea.
Jo
J Y
JY
Kim
Y S
YS
Chang
Y J
YJ
Lee
J S
JS
Yoon
Jong-Gul
JG
Song
T K
TK
Noh
T W
TW