title: Polarization relaxation induced by a depolarization field in ultrathin ferroelectric capacitors.
abstract: Time-dependent polarization relaxation behavior induced by a depolarization field E(d) was investigated on high-quality ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors. The E(d) values were determined experimentally from an applied external field to stop the net polarization relaxation. These values agree with those from the electrostatic calculations, demonstrating that a large E(d) inside the ultrathin ferroelectric layer could cause severe polarization relaxation. For numerous ferroelectric devices of capacitor configuration, this effect will set a stricter size limit than the critical thickness issue.
authors.affiliation: ReCOE and School of Physics, Seoul National University, Seoul 151-747, Korea.
authors.forename: D J
authors.initials: DJ
authors.lastname: Kim
authors.forename: J Y
authors.initials: JY
authors.lastname: Jo
authors.forename: Y S
authors.initials: YS
authors.lastname: Kim
authors.forename: Y J
authors.initials: YJ
authors.lastname: Chang
authors.forename: J S
authors.initials: JS
authors.lastname: Lee
authors.forename: Jong-Gul
authors.initials: JG
authors.lastname: Yoon
authors.forename: T K
authors.initials: TK
authors.lastname: Song
authors.forename: T W
authors.initials: TW
authors.lastname: Noh