title: Electron attachment and detachment, and the electron affinities of C5F5N and C5HF4N.
abstract: Rate constants have been measured for electron attachment to C5F5N (297-433 K) and to 2, 3, 5, 6-C5HF4N (303 K) using a flowing-afterglow Langmuir-probe apparatus (at a He gas pressure of 133 Pa). In both cases only the parent anion was formed in the attachment process. The attachment rate constants measured at room temperature are 1.8 +/- 0.5 X 10(-7) and 7 +/- 3 X 10(-10) cm(-3) s(-1), respectively. Rate constants were also measured for thermal electron detachment from the parent anions of these molecules. For C5F5N- detachment is negligible at room temperature, but increases to 2530 +/- 890 s(-1) at 433 K. For 2, 3, 5, 6-C5HF4N-, the detachment rate at 303 K was 520 +/- 180 s(-1). The attachment/detachment equilibrium yielded experimental electron affinities EA(C5F5N)=0.70 +/- 0.05 eV and EA(2, 3, 5, 6-C5HF4N)=0.40 +/- 0.08 eV. Electronic structure calculations were carried out for these molecules and related C5HxF5-xN using density-functional theory and the G3(MP2)//B3LYP compound method. The EAs are found to decrease by 0.25 eV, on average, with each F substitution by H. The calculated EAs are in good agreement with the present experimental results.
authors.affiliation: Department of Chemistry, College of the Holy Cross, Worcester, MA 01610-2395, USA. jvandoren@holycross.edu
authors.forename: Jane M
authors.initials: JM
authors.lastname: Van Doren
authors.forename: Donna M
authors.initials: DM
authors.lastname: Kerr
authors.forename: Thomas M
authors.initials: TM
authors.lastname: Miller
authors.forename: A A
authors.initials: AA
authors.lastname: Viggiano