Two-dimensional imaging theory of confocal self-interference microscopy.
A two-dimensional coherent imaging equation is derived for confocal self-interference microscopy (CSIM), which uses a birefringent material to generate an interference pattern in the detection optics. This interference pattern, called a self-interference pattern, sharpens the point-spread function (PSF) along the lateral direction. To derive the imaging equation, an equation for the self-interference pattern is derived. Numerical simulation results based on the imaging equation are presented. One-point response results show a 42.8% reduction in the FWHM of the lateral PSF. Two-point response results show a nearly twofold improvement in two-point resolution.
Kang
DongKyun
D
Nano Opto-Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Guseong-dong, Yuseong-gu, Daejeon 305701, South Korea. godogo@kaist.ac.kr
Gweon
DaeGab
D
D000465:Algorithms; D003198:Computer Simulation; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D007368:Interferometry / Q000379:methods*; D018613:Microscopy, Confocal / Q000379:methods*; D008954:Models, Biological; D012031:Refractometry / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity