Nanomechanics of silicon surfaces with atomic force microscopy: an insight to the first stages of plastic deformation.
The use of stiff cantilevers with diamond tips allows us to perform nanoindentations on hard covalent materials such as silicon with atomic force microscopy. Thanks to the high sensitivity in the force measurements together with the high resolution upon imaging the surface, we can study nanomechanical properties. At this scale, the surface deforms, following a simple non-Hertzian spring model. The plastic onset can be assessed from a discontinuity in the force-distance curves. Hardness measurements with penetration depths as small as 1 nm yield H= approximately 25 GPa, thus showing a drastic increase with penetration depths below 5 nm.
Garcia-Manyes
Sergi
S
Center for Bioengineering of Catalonia (CREBEC) and Department of Physical Chemistry, University of Barcelona, Spain.
Güell
Aleix G
AG
Gorostiza
Pau
P
Sanz
Fausto
F
D003198:Computer Simulation; D004548:Elasticity; D006244:Hardness; D006245:Hardness Tests / Q000379:methods*; D019563:Mechanics; D018625:Microscopy, Atomic Force / Q000379:methods*; D008956:Models, Chemical; D008958:Models, Molecular; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D012825:Silicon / Q000737:chemistry*; D013314:Stress, Mechanical; D013499:Surface Properties
D012825:Silicon