title: An approach to the systematic distortion correction in aberration-corrected HAADF images.
abstract: Systematic distortion has been analysed in high-angle annular dark-field (HAADF) images which may be caused by electrical interference. Strain mapping techniques have been applied to a strain-free GaAs substrate in order to provide a broad analysis of the influence of this distortion on the determination of local strain in the heterostructure. We have developed a methodology for estimating the systematic distortion, and we correct the original images by using an algorithm that removes this systematic distortion.
authors.affiliation: Departamento de Ciencia de los Materiales e I.M. y Q.I., Universidad de Cadiz, Puerto Real, 11510, Spain. ana.fuentes@uca.es
authors.forename: A M
authors.initials: AM
authors.lastname: Sanchez
authors.forename: P L
authors.initials: PL
authors.lastname: Galindo
authors.forename: S
authors.initials: S
authors.lastname: Kret
authors.forename: M
authors.initials: M
authors.lastname: Falke
authors.forename: R
authors.initials: R
authors.lastname: Beanland
authors.forename: P J
authors.initials: PJ
authors.lastname: Goodhew