title: VideoAFM--a new tool for high speed surface analysis.
abstract: The VideoAFM provides a 1000 fold increase in image rate compared to conventional atomic force microscopes, giving nanometre resolution images of surfaces at a rate of 15 frames s(-1), which is approximately 1 million pixels s(-1). Images of high stiffness surfaces such as calibration grids are provided for the first time, and allow for a more rigorous examination of the meaning of the data obtained with the VideoAFM. Instrumental changes that could provide true topographic images are discussed. The advantages of a high speed scanning technique that is integrated within a conventional AFM are outlined. Particular emphasis is given to the capability to 'tile' images, and hence rapidly map large areas with nanometre resolution. It is found that the inherent increase in stability that comes from a high frame rate leads to the possibility of manually manipulating the sample while maintaining a sharp image, allowing real-time user interaction with the AFM. The possible application of the VideoAFM approach for the very rapid analysis of surface properties and, ultimately, surface chemistry is discussed and some possible routes are given.
authors.affiliation: Department of Chemistry, University of Sheffield, Brook Hill, Sheffield S3 7HF, UK. jamie.hobbs@sheffield.ac.uk
authors.forename: Jamie K
authors.initials: JK
authors.lastname: Hobbs
authors.forename: Cvetelin
authors.initials: C
authors.lastname: Vasilev
authors.forename: Andrew D L
authors.initials: AD
authors.lastname: Humphris
mesh_terms: D018625:Microscopy, Atomic Force / Q000379:methods*; D011791:Quartz; D012822:Silicon Dioxide; D013499:Surface Properties; D014741:Video Recording
chemical_list: D011791:Quartz; D012822:Silicon Dioxide