title: Raman microprobe analysis of elastic strain and fracture in electrophoretically deposited CdSe nanocrystal films.
abstract: The mechanical stability of nanocrystal films is critical for applications, yet largely unexplored. Raman microprobe analysis used here to probe the nanocrystal cores of thick, fractured electrophoretically deposited films of 3.2 nm diameter CdSe nanocrystals measures approximately 2.5% in-plane tensile strain in cores of unfractured films. The crack dimensions determine the overall in-plane film strain, approximately 11.7%, and the film biaxial modulus, approximately 13.8 GPa, from which the biaxial modulus of the trioctylphosphine oxide ligand matrix is inferred, approximately 5.1 GPa.
authors.affiliation: Materials Research Science and Engineering Center, Columbia University, New York, New York 10027, USA.
authors.forename: Sarbajit
authors.initials: S
authors.lastname: Banerjee
authors.forename: Shengguo
authors.initials: S
authors.lastname: Jia
authors.forename: Dae I
authors.initials: DI
authors.lastname: Kim
authors.forename: Richard D
authors.initials: RD
authors.lastname: Robinson
authors.forename: Jeffrey W
authors.initials: JW
authors.lastname: Kysar
authors.forename: Joze
authors.initials: J
authors.lastname: Bevk
authors.forename: Irving P
authors.initials: IP
authors.lastname: Herman
mesh_terms: D019187:Cadmium Compounds / Q000737:chemistry*; D004586:Electrophoresis / Q000379:methods; D008567:Membranes, Artificial; D049329:Nanostructures / Q000737:chemistry*; D010316:Particle Size; D018036:Selenium Compounds / Q000737:chemistry*; D012680:Sensitivity and Specificity; D013059:Spectrum Analysis, Raman / Q000379:methods*; D013499:Surface Properties
chemical_list: D019187:Cadmium Compounds; D008567:Membranes, Artificial; D018036:Selenium Compounds; C058667:cadmium selenide