Raman microprobe analysis of elastic strain and fracture in electrophoretically deposited CdSe nanocrystal films.
The mechanical stability of nanocrystal films is critical for applications, yet largely unexplored. Raman microprobe analysis used here to probe the nanocrystal cores of thick, fractured electrophoretically deposited films of 3.2 nm diameter CdSe nanocrystals measures approximately 2.5% in-plane tensile strain in cores of unfractured films. The crack dimensions determine the overall in-plane film strain, approximately 11.7%, and the film biaxial modulus, approximately 13.8 GPa, from which the biaxial modulus of the trioctylphosphine oxide ligand matrix is inferred, approximately 5.1 GPa.
Banerjee
Sarbajit
S
Materials Research Science and Engineering Center, Columbia University, New York, New York 10027, USA.
Jia
Shengguo
S
Kim
Dae I
DI
Robinson
Richard D
RD
Kysar
Jeffrey W
JW
Bevk
Joze
J
Herman
Irving P
IP
D019187:Cadmium Compounds / Q000737:chemistry*; D004586:Electrophoresis / Q000379:methods; D008567:Membranes, Artificial; D049329:Nanostructures / Q000737:chemistry*; D010316:Particle Size; D018036:Selenium Compounds / Q000737:chemistry*; D012680:Sensitivity and Specificity; D013059:Spectrum Analysis, Raman / Q000379:methods*; D013499:Surface Properties
D019187:Cadmium Compounds; D008567:Membranes, Artificial; D018036:Selenium Compounds; C058667:cadmium selenide