Water density in the electric double layer at the insulator/electrolyte solution interface.
I studied the spatial structure of the thick transition region between n-hexane and a colloidal solution of 7-nm silica particles by X-ray reflectivity and grazing incidence small-angle scattering. The interfacial structure is discussed in terms of a semiquantitative interface model wherein the potential gradient at the n-hexane/sol interface reflects the difference in the potentials of "image forces" between the cationic Na(+) and anions (nanoparticles) and the specific adsorption of surface charge at the interface between the adsorbed layer and the solution, as well as at the interface between the adsorbed layer and n-hexane. The X-ray scattering data revealed that the average density of water in the field approximately 10(9)-10(10) V/m of the electrical double layer at the hexane/silica sol interface is the same as, or only few percent higher (1-7%) than, its density under normal conditions.
Tikhonov
Aleksey M
AM
University of Chicago, Consortium of Advanced Radiation Sources, Brookhaven National Laboratory, National Synchrotron Light Source, Beamline X19C, Upton, New York 11973, USA. tikhonov@bnl.gov
D003102:Colloids / Q000737:chemistry; D004553:Electric Conductivity; D004573:Electrolytes / Q000737:chemistry*; D006586:Hexanes / Q000737:chemistry; D008567:Membranes, Artificial; D053838:Scattering, Small Angle; D012822:Silicon Dioxide / Q000737:chemistry; D012996:Solutions / Q000737:chemistry; D013499:Surface Properties; D014867:Water / Q000737:chemistry; D014961:X-Ray Diffraction
D003102:Colloids; D004573:Electrolytes; D006586:Hexanes; D008567:Membranes, Artificial; D012996:Solutions; D014867:Water; C026385:n-hexane; D012822:Silicon Dioxide