A new approach to measuring high-resolution magnetic Compton profiles.
It is demonstrated that long-term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid-state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds.
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan. hiroshi.kawata@kek.jp
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H
Kawata
H
H
Sakurai
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N
Shiotani
Y
Y
Watanabe