Gating a channel photomultiplier with a fast high-voltage switch: reduction of afterpulse rates in a laser-induced fluorescence instrument for measurement of atmospheric OH radical concentrations.
By employing a commercially available high-voltage switch in a time-gating circuit to drive a channel photomultiplier (CPM), the afterpulse rates are significantly reduced in the time window to collect fluorescence >200 ns after the pulsed laser excitation. The CPM, kept deactivated under normal conditions (normally off), is turned on immediately after the passage of the laser pulse by shifting the voltage applied to the photocathode by 150 V to collect the fluorescence. When the detection system is used as part of a laser-induced fluorescence instrument to measure atmospheric OH radicals with the photon-counting method, the background signal is reduced by more than a factor of 10 as compared with our previous case where a conventional dynode-gated photomultiplier tube (PMT) is used, while the sensitivity toward the fluorescence is almost unchanged. A detection limit as low as 2 x 10(5) radicals cm-3 or 0.008 parts per trillion by volume is achieved for OH, with an integration time of 1 min and a signal-to-noise ratio of 2, enabling sensitive detection of the important radical in the atmosphere. This system is a superior choice with higher sensitivity and cost effectiveness as compared with the gated PMITs utilizing a microchannel plate as an electron multiplier, and could also be used effectively in light detection and ranging (lidar) instruments, where a delayed scattering signal would be efficiently discriminated from afterpulses.
Kanaya
Yugo
Y
Frontier Research Center for Global Change, Japan Agency for Marine-Earth Science and Technology, 3173-25 Showa-machi, Kanazawa-ku, Yokohoma, Kanagawa 236-0001, Japan. yugo@jamstec.go.jp
Akimoto
Hajime
H
D000393:Air Pollutants / Q000032:analysis*; D004581:Electronics; D004784:Environmental Monitoring / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis; D017665:Hydroxyl Radical / Q000032:analysis*; D007089:Image Enhancement / Q000295:instrumentation*; D007834:Lasers; D010783:Photometry / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation; D013050:Spectrometry, Fluorescence / Q000295:instrumentation* / Q000379:methods
D000393:Air Pollutants; D017665:Hydroxyl Radical