Simultaneous absorption, scattering, and luminescence mappings for the characterization of optical coatings and surfaces.
An experimental setup, based on the laser-induced deflection technique, is developed to measure simultaneously the 244 nm laser absorption, scattering, and luminescence on optical components. The different techniques and methods that have been specifically developed to obtain both high resolution (micronic) and sensitivity (a few 10(-7) of the incident power for the absorption, 10(-8) for scattering and fluorescence) are presented. Different applications are then explored: the study of losses in deep UV multilayer coatings (HfO2/SiO2 mirrors) and the analysis of contamination defects on bare substrate and structural defects in optical coatings.
Gallais
Laurent
L
Institut Fresnel, Unité Mixte de Recherche, Ecole Généraliste d'Ingénieurs de Marseille--Aix Marselle I--Aix Marseille III, Domaine Universitaire de Saint Jerome, 13397, Marseille Cedex 20, France. laurent.gallais@fresnel.fr
Commandré
Mireille
M