Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscope.
In this study, we demonstrated the use of electron-beam-induced deposition for synthesis of artificial two-dimensional crystals with an in situ scanning transmission electron microscope. The structures were deposited from W(CO)6 in an environmental scanning transmission electron microscope on a 30-nm-thick Si3N4 substrate. We present clear electron beam diffraction patterns taken from those structures. The distance between the diffraction peaks corresponded to the dot spacing in the self-made surface crystal. We propose using these arrays of dots as anchor points for making artificial crystals for diffraction analysis of weakly scattering or beam-sensitive molecules such as proteins.
Delft University of Technology, Faculty of Applied Sciences, Lorentzweg 1, 2628 CJ Delft, the Netherlands.
W F
WF
van Dorp
B
B
van Someren
C W
CW
Hagen
P
P
Kruit
P A
PA
Crozier