Fabrication of an atomic resolution low cost STM-SNOM hybrid probe.
We derived a simple method to fabricate STM-SNOM hybrid probes obtained from commercial cheap communication optical fibers. The tips are fabricated by a methodology that combines two well-known techniques: the selective attack by a buffered solution and the protected layer chemical etching, in a single new one-step technique. The tailored probes are then sputtered by metal and mounted on a STM setup. The usual difficulties of integrating the optical fiber in the STM head are solved originally with a particular home made mount described in details. We will show that the resulting probes reach atomic resolution on both vertical and horizontal scale, and that the optical imaging is free of artifacts and satisfactory with a lateral resolution in the order of lamda/20, as far as we know the finest resolution obtained with a system based on a hybrid fiber probe. We believe that our methodology is very interesting for its simplicity of realization and for the good resolving power in both SNOM and STM modes.
Department of Electronic Science, Kyoto University, Nishigyo-ku, Katsura 615-8510, Kyoto, Japan.
Ruggero
R
Micheletto
Masatoshi
M
Yokokawa
Satoshi
S
Okazakaki
Yoichi
Y
Kawakami
D004867:Equipment Design; D007840:Latex / Q000737:chemistry; D033401:Microscopy, Acoustic / Q000295:instrumentation / Q000379:methods; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry; D012680:Sensitivity and Specificity
D007840:Latex