title: Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope.
abstract: An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (DeltaE/E approximately 10(-4)) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible.
authors.affiliation: Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennnoudai, Tsukuba, Ibaraki 305-8573, Japan. yamamoto@aokilab.bk.tsukuba.ac.jp
authors.forename: K
authors.initials: K
authors.lastname: Yamamoto
authors.forename: N
authors.initials: N
authors.lastname: Watanabe
authors.forename: A
authors.initials: A
authors.lastname: Takeuchi
authors.forename: H
authors.initials: H
authors.lastname: Takano
authors.forename: T
authors.initials: T
authors.lastname: Aota
authors.forename: M
authors.initials: M
authors.lastname: Fukuda
authors.forename: S
authors.initials: S
authors.lastname: Aoki