title: X-ray diffraction on Si single crystal with a W-shaped longitudinal groove.
abstract: The measurement of the sagittal deviation of an X-ray beam diffracted on the inclined surface of an Si(111) single crystal was performed on beamline BM5 at the ESRF, with lambda = 0.1 nm and an inclination angle, beta, of 70 degrees . The measured value agrees with the theory developed in previous papers. The topographic picture of the longitudinal edge shows a structure that can be explained in terms of the properties of inclined diffraction.
authors.affiliation: Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 18221 Praha 8, Czech Republic.
authors.forename: N
authors.initials: N
authors.lastname: Artemiev
authors.forename: E
authors.initials: E
authors.lastname: Busetto
authors.forename: J
authors.initials: J
authors.lastname: Hrdý
authors.forename: O
authors.initials: O
authors.lastname: Pacherová
authors.forename: A
authors.initials: A
authors.lastname: Snigirev
authors.forename: A
authors.initials: A
authors.lastname: Suvorov