title: Influence of the third-order parameter on diffuse reflectance at small source-detector separations.
abstract: Spatially resolved reflectance close to source has received a great deal of attention recently. This research is considered to develop a new noninvasive technique for measuring the optical properties of biological media. Using Monte Carlo simulations, we investigated the influence of third-order parameter 5 on diffuse reflectance and found that the reflectance decreased with an increase of delta at a short source-detector separation of approximately 0.7-2 transport mean free paths. We show that the effects of two parameters, y and second-order parameter delta, on the reflectance are contrary. As a result the influence of the second-order parameter y on the reflectance is irregular when the condition delta delta<<delta gamma is not satisfied.
authors.affiliation: College of Science, Key Laboratory of Opto-electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 300072, China. tianhjgx@126.com
authors.forename: Huijuan
authors.initials: H
authors.lastname: Tian
authors.forename: Ying
authors.initials: Y
authors.lastname: Liu
authors.forename: Lijun
authors.initials: L
authors.lastname: Wang
mesh_terms: D000465:Algorithms; D016477:Artifacts; D003198:Computer Simulation; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008027:Light; D008954:Models, Biological; D015233:Models, Statistical; D009010:Monte Carlo Method; D009391:Nephelometry and Turbidimetry / Q000379:methods*; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation; D041622:Tomography, Optical / Q000379:methods*