Propulsion of ripples on glass by ion bombardment.
The propulsion of surface ripples on SiO(2) by an ion beam was investigated by in situ electron microscopy. The observed propagation of the ripples contradicts existing models for ion-beam-induced ripple development. A new model based on the Navier-Stokes relations for viscous flow in a thin layer is introduced. It includes inhomogeneous viscous flow, driven by spatial variations in the deposition of the energy of the ion beam. The model explains the observed reversed propagation. The hitherto unknown propulsion mechanism is important for understanding nanoscale pattern formation by ion bombardment.
Alkemade
P F A
PF
National Center of High Resolution Electron Microscopy and Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.