title: A novel application of silicon microstrip technology for energy-dispersive EXAFS studies.
abstract: A prototype X-ray detector for energy-dispersive EXAFS has been developed and tested to demonstrate the principle of using silicon microstrip detector technology for this application. Testing took place at the UK Synchrotron Radiation Source, where the absorption spectra of a 5 microm Ni foil and a 25 mM NiCl(2) solution were obtained.
authors.affiliation: Blackett Laboratory, Imperial College, London SW7 2BZ, UK. gm.iles@ic.ac.uk
authors.forename: G
authors.initials: G
authors.lastname: Iles
authors.forename: A
authors.initials: A
authors.lastname: Dent
authors.forename: G
authors.initials: G
authors.lastname: Derbyshire
authors.forename: R
authors.initials: R
authors.lastname: Farrow
authors.forename: G
authors.initials: G
authors.lastname: Hall
authors.forename: G
authors.initials: G
authors.lastname: Noyes
authors.forename: M
authors.initials: M
authors.lastname: Raymond
authors.forename: G
authors.initials: G
authors.lastname: Salvini
authors.forename: P
authors.initials: P
authors.lastname: Seller
authors.forename: M
authors.initials: M
authors.lastname: Smith
authors.forename: S
authors.initials: S
authors.lastname: Thomas