Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering.
A double flat-crystal analyzer for inelastic X-ray scattering is described. The general correlation between the energy and direction of the X-rays transmitted by the analyzer allows one to collect data for a range of energy transfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X-ray optic can be an alternative to a conventional spherical-focusing backscattering analyzer in resonant inelastic X-ray scattering experiments or when flexible energy resolution or high momentum resolution is required.
Bortel
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Advanced Photon Source, Argonne National Laboratory, Argonne IL 60439, USA. gb@szfki.hu
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Sturhahn
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Toellner
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