title: Effect of surface roughness on the spatial coherence of X-ray beams from third-generation synchrotron radiation sources.
abstract: The effect of the surface roughness of optical elements, such as Be windows and reflection mirrors, in synchrotron radiation beamlines on the spatial coherence of the X-ray beam is investigated systematically by means of digital simulation, in which a new model for X-ray reflection from a rough surface is proposed. A universal factor is employed to evaluate the spatial coherence quantitatively, based on which critical values for surface roughness are reached. The results from simulation are consistent with those from experiments.
authors.affiliation: Shanghai Institute of Nuclear Research, Academia Sinica, PO Box 800-204, Shanghai 201800, People's Republic of China.
authors.forename: Y
authors.initials: Y
authors.lastname: Wang
authors.forename: T
authors.initials: T
authors.lastname: Xiao
authors.forename: H
authors.initials: H
authors.lastname: Xu