title: Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering.
abstract: A double flat-crystal analyzer for inelastic X-ray scattering is described. The general correlation between the energy and direction of the X-rays transmitted by the analyzer allows one to collect data for a range of energy transfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X-ray optic can be an alternative to a conventional spherical-focusing backscattering analyzer in resonant inelastic X-ray scattering experiments or when flexible energy resolution or high momentum resolution is required.
authors.affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne IL 60439, USA. gb@szfki.hu
authors.forename: G
authors.initials: G
authors.lastname: Bortel
authors.forename: E E
authors.initials: EE
authors.lastname: Alp
authors.forename: W
authors.initials: W
authors.lastname: Sturhahn
authors.forename: T S
authors.initials: TS
authors.lastname: Toellner