Survival probability time distribution in dielectric cavities.
We study the survival probability time distribution (SPTD) in dielectric cavities. In a circular dielectric cavity the SPTD has an algebraic long time behavior, approximately t(-2) in both the TM and TE cases, but shows different short time behaviors due to the existence of the Brewster angle in the TE case where the short time behavior is exponential. The SPTD for a stadium-shaped cavity decays exponentially, and the exponent shows a relation of gamma approximately n(-2), n is the refractive index, and the proportional coefficient is obtained from a simple model of the steady probability distribution. We also discuss the SPTD for a quadrupolar deformed cavity and show that the long time behavior can be algebraic or exponential depending on the location of islands.
Ryu
Jung-Wan
JW
National Creative Research Initiative Center for Controlling Optical Chaos, Pai-Chai University, Daejeon 302-735, Korea.
Lee
Soo-Young
SY
Kim
Chil-Min
CM
Park
Young-Jai
YJ