Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope.
An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (DeltaE/E approximately 10(-4)) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible.
Yamamoto
K
K
Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennnoudai, Tsukuba, Ibaraki 305-8573, Japan. yamamoto@aokilab.bk.tsukuba.ac.jp
Watanabe
N
N
Takeuchi
A
A
Takano
H
H
Aota
T
T
Fukuda
M
M
Aoki
S
S