Single-element objective lens for soft x-ray differential interference contrast microscopy.
High-resolution soft x-ray differential interference contrast (DIC) imaging was demonstrated through the use of a single-element objective, the XOR pattern, in a full-field soft x-ray microscope. DIC images of the magnetic domains in a 59 nm thick amorphous Gd25Fe75 layer were obtained and magnetic phase contributions were directly imaged. With its elemental, chemical, and magnetic specificity, compatibility with various sample environments, and ease of implementation, we expect this soft x-ray DIC technique to become one of the standard modes of operation for existing full-field soft x-ray microscopes.
Chang
Chang
C
School of Biomedical Engineering, Science and Health Systems, Drexel University, Philadelphia, Pennsylvania 19104, USA. chang.chang@drexel.edu
Sakdinawat
Anne
A
Fischer
Peter
P
Anderson
Erik
E
Attwood
David
D