Full-field swept-source phase microscopy.
We present a full-field phase microscopy technique for quantitative nanoscale surface profiling of samples in reflection. This technique utilizes swept-source optical coherence tomography in a full-field common path interferometer for phase-stable cross-sectional acquisition without scanning. Subwavelength variations in surface sample features are measured without interference from spurious reflections by processing the interferometric phase at a selected depth plane, providing a 1.3 nm stability for high signal-to-noise ratio surface features. Nanoscale imaging was demonstrated by measuring the location of receptor sites on a DNA assay biochip and the surface topography of erythrocytes in a blood smear.
Sarunic
Marinko V
MV
Department of Biomedical Engineering, Duke University, Durham, North Carolina 27708, USA. mvs5@duke.edu
Weinberg
Seth
S
Izatt
Joseph A
JA
D002478:Cells, Cultured; D004867:Equipment Design; D019544:Equipment Failure Analysis; D004912:Erythrocytes / Q000648:ultrastructure*; D006801:Humans; D007089:Image Enhancement / Q000295:instrumentation / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation* / Q000379:methods; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D041623:Tomography, Optical Coherence / Q000295:instrumentation* / Q000379:methods