title: Single-element objective lens for soft x-ray differential interference contrast microscopy.
abstract: High-resolution soft x-ray differential interference contrast (DIC) imaging was demonstrated through the use of a single-element objective, the XOR pattern, in a full-field soft x-ray microscope. DIC images of the magnetic domains in a 59 nm thick amorphous Gd25Fe75 layer were obtained and magnetic phase contributions were directly imaged. With its elemental, chemical, and magnetic specificity, compatibility with various sample environments, and ease of implementation, we expect this soft x-ray DIC technique to become one of the standard modes of operation for existing full-field soft x-ray microscopes.
authors.affiliation: School of Biomedical Engineering, Science and Health Systems, Drexel University, Philadelphia, Pennsylvania 19104, USA. chang.chang@drexel.edu
authors.forename: Chang
authors.initials: C
authors.lastname: Chang
authors.forename: Anne
authors.initials: A
authors.lastname: Sakdinawat
authors.forename: Peter
authors.initials: P
authors.lastname: Fischer
authors.forename: Erik
authors.initials: E
authors.lastname: Anderson
authors.forename: David
authors.initials: D
authors.lastname: Attwood