title: Quantitative phase-contrast microscopy by a lateral shear approach to digital holographic image reconstruction.
abstract: Combining the concept of lateral shear interferometry (LSI) within a digital holography microscope, we demonstrate that it is possible to obtain quantitative optical phase measurement in microscopy by a new single-image-processing procedure. Numerical lateral shear of the reconstructed wavefront in the image plane makes it possible to retrieve the derivative of the wavefront and remove the defocus aberration term introduced by the microscope objective. The method is tested to investigate a silicon structure and a mouse cell line.
authors.affiliation: CNR--Istituto Nazionale di Ottica Applicata, Pozzuoli (Na), Italy. p.ferraro@cib.na.cnr.it
authors.forename: P
authors.initials: P
authors.lastname: Ferraro
authors.forename: D
authors.initials: D
authors.lastname: Alferi
authors.forename: S
authors.initials: S
authors.lastname: De Nicola
authors.forename: L
authors.initials: L
authors.lastname: De Petrocellis
authors.forename: A
authors.initials: A
authors.lastname: Finizio
authors.forename: G
authors.initials: G
authors.lastname: Pierattini
mesh_terms: D000465:Algorithms; D006696:Holography / Q000295:instrumentation / Q000379:methods*; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D016247:Information Storage and Retrieval / Q000379:methods; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted