title: Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
abstract: Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectively coated with a silicon dioxide layer.
authors: Department of Physics and Astronomy, Brigham Young University, Provo, Utah 84602, USA.
authors: Jed D
authors: JD
authors: Whittaker
authors: Ethan D
authors: ED
authors: Minot
authors: David M
authors: DM
authors: Tanenbaum
authors: Paul L
authors: PL
authors: McEuen
authors: Robert C
authors: RC
authors: Davis