Low-frequency current fluctuations in individual semiconducting single-wall carbon nanotubes.
We present a systematic study on low-frequency current fluctuations of nanodevices consisting of one single semiconducting nanotube, which exhibit significant 1/f-type noise. By examining devices with different switching mechanisms, carrier types (electrons vs holes), and channel lengths, we show that the 1/f fluctuation level in semiconducting nanotubes is correlated to the total number of transport carriers present in the system. However, the 1/f noise level per carrier is not larger than that of most bulk conventional semiconductors, e.g., Si. The pronounced noise level observed in nanotube devices simply reflects on the small number of carriers involved in transport. These results not only provide the basis to quantify the noise behavior in a one-dimensional transport system but also suggest a valuable way to characterize low-dimensional nanostructures based on the 1/f fluctuation phenomenon.
Lin
Yu-Ming
YM
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA. yming@us.ibm.com
Appenzeller
Joerg
J
Knoch
Joachim
J
Chen
Zhihong
Z
Avouris
Phaedon
P