title: A femtogram resolution mass sensor platform, based on SOI electrostatically driven resonant cantilever. Part I: electromechanical model and parameter extraction.
abstract: A microcantilever based platform for mass detection in the femtogram range has been integrated in the doped top silicon layer of a SOI substrate. The on-plane fundamental resonance mode of the cantilever is excited electrostatically and detected capacitively by means of two parallel placed electrodes in a two port configuration. An electromechanical model of the cantilever-electrodes transducer and its implementation in a SPICE environment are presented. The model takes into account non-linearities from variable cantilever-electrode gap, fringing field contributions and real deflection shape of the cantilever for the calculation of the driving electrostatic force. A fitting of the model to the measured S(21) transmitted power frequency response is performed to extract the characteristic sensor parameters as Young modulus, Q factor, electrical parasitics and mass responsivity.
authors: Dept. d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, Bellaterra E- 08193, Spain. Jorge.Teva@uab.es
authors: J
authors: J
authors: Teva
authors: G
authors: G
authors: Abadal
authors: F
authors: F
authors: Torres
authors: J
authors: J
authors: Verd
authors: F
authors: F
authors: Pérez-Murano
authors: N
authors: N
authors: Barniol