title: Probing organic field effect transistors in situ during operation using SFG.
abstract: In this communication, we report results obtained using surface-sensitive IR+Visible Sum Frequency Generation (SFG) nonlinear optical spectroscopy on interfaces of organic field effect transistors during operation. We observe remarkable correlations between trends in the surface vibrational spectra and electrical properties of the transistor, with changes in gate voltage (VG). These results suggest that field effects on electronic conduction in thin film organic semiconductor devices are correlated to interfacial nonlinear optical characteristics and point to the possibility of using SFG spectroscopy to monitor electronic properties of OFETs.
authors.affiliation: Department of Chemical and Biomolecular Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
authors.forename: Hongke
authors.initials: H
authors.lastname: Ye
authors.forename: Ashraf
authors.initials: A
authors.lastname: Abu-Akeel
authors.forename: Jia
authors.initials: J
authors.lastname: Huang
authors.forename: Howard E
authors.initials: HE
authors.lastname: Katz
authors.forename: David H
authors.initials: DH
authors.lastname: Gracias