Classification of epilepsy types through global network analysis of scalp electroencephalograms.
Epilepsy is a dynamic disease in which self-organization and emergent structures occur dynamically at multiple levels of neuronal integration. Therefore, the transient relationship within multichannel electroencephalograms (EEGs) is crucial for understanding epileptic processes. In this paper, we show that the global relationship within multichannel EEGs provides us with more useful information in classifying two different epilepsy types than pairwise relationships such as cross correlation. To demonstrate this, we determine the global network structure within channels of the scalp EEG based on the minimum spanning tree method. The topological dissimilarity of the network structures from different types of temporal lobe epilepsy is described in the form of the divergence rate and is computed for 11 patients with left (LTLE) and right temporal lobe epilepsy (RTLE). We find that patients with LTLE and RTLE exhibit different large scale network structures, which emerge at the epoch immediately before the seizure onset, not in the preceding epochs. Our results suggest that patients with the two different epilepsy types display distinct large scale dynamical networks with characteristic epileptic network structures.
Lee
UnCheol
U
Asia Pacific Center for Theoretical Physics & Nonlinear Complex Systems Laboratory, National Core Research Center on System Biodynamics, Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Korea. uclee@postech.ac.kr
Kim
Seunghwan
S
Jung
Ki-Young
KY
D001185:Artificial Intelligence; D001921:Brain / Q000503:physiopathology*; D001931:Brain Mapping / Q000379:methods*; D003936:Diagnosis, Computer-Assisted / Q000379:methods*; D004569:Electroencephalography / Q000379:methods*; D004827:Epilepsy / Q000145:classification / Q000175:diagnosis* / Q000503:physiopathology*; D006801:Humans; D009415:Nerve Net / Q000503:physiopathology*; D015203:Reproducibility of Results; D012535:Scalp; D012680:Sensitivity and Specificity