title: Application of a CdTe Solid-State Detector to Polarization-Dependent Total-Reflection Fluorescence XAFS Measurements.
abstract: A CdTe solid-state detector was applied to the measurement of polarization-dependent total-reflection fluorescence XAFS spectra. The data revealed that the detector has good sensitivity, and this, together with its compact size, make it appropriate for in-situ measurements and removal of X-ray Bragg diffraction. The detector efficiently recorded the high-energy K-edge XAFS spectra for molybdenum oxides supported on TiO(2) (110).
authors.forename: W J
authors.initials: WJ
authors.lastname: Chun
authors.forename: K
authors.initials: K
authors.lastname: Asakura
authors.forename: Y
authors.initials: Y
authors.lastname: Iwasawa