title: An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.
abstract: We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020, Antwerp, Belgium. mihail.croitoru@ua.ac.be
authors.forename: M D
authors.initials: MD
authors.lastname: Croitoru
authors.forename: D
authors.initials: D
authors.lastname: Van Dyck
authors.forename: S
authors.initials: S
authors.lastname: Van Aert
authors.forename: S
authors.initials: S
authors.lastname: Bals
authors.forename: J
authors.initials: J
authors.lastname: Verbeeck