title: Application of magnetic force microscopy in nanomaterials characterization.
abstract: This review describes the basic technical aspects of magnetic force microscopy and how this technique has been applied to the study of colossal magnetoresistance materials, superconductors, and patterned magnetic materials. Recently, current distribution in a patterned aluminum strip has been measured by magnetic force microscopy, opening the possibility of measuring currents in buried interconnects in integrated circuits.
authors.affiliation: Department of Physics, Center for Nano and Molecular Science and Technology, and Texas Materials Institute, University of Texas, Austin, Texas 78712, USA. delozanne@physics.utexas.edu
authors.forename: Alex
authors.initials: A
authors.lastname: de Lozanne
mesh_terms: D007501:Iron; D008280:Magnetics; D008670:Metals / Q000032:analysis / Q000737:chemistry; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry / Q000648:ultrastructure*
chemical_list: D008670:Metals; D007501:Iron