title: Refraction-angle resolution of diffraction enhanced imaging.
abstract: As a new method, x-ray diffraction enhanced imaging (DEI) has extremely high sensitivity for weakly absorbing low-Z samples in medical and biological fields. Conventional performance parameters, such as spatial resolution and low-contrast resolution, are not enough to describe the characteristics of a DEI system. This paper focuses on refraction-angle resolution which describes the ability of a DEI system to differentiate the x-rays refracted by the sample. The analysis of refraction-angle resolution is composed of two parts: the analysis of the single DEI image measured in a certain position of the rocking curve and the analysis of the refraction-angle image calculated by extraction methods. A 2D computer simulation experiment is performed to prove the results of the analyses. The limitations and conclusions of refraction-angle resolution are described in the end.
authors.affiliation: Department of Engineering Physics, Tsinghua University, Beijing, 100 084, People's Republic of China. huangzhif97@gmail.com
authors.forename: Zhi-Feng
authors.initials: ZF
authors.lastname: Huang
authors.forename: Ke-Jun
authors.initials: KJ
authors.lastname: Kang
authors.forename: Zheng
authors.initials: Z
authors.lastname: Li
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D016247:Information Storage and Retrieval / Q000379:methods; D008954:Models, Biological; D012031:Refractometry / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014961:X-Ray Diffraction / Q000379:methods*