title: Observation of mechanically induced luminescence from microparticles.
abstract: We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.
authors.affiliation: National Institute of Advanced Industrial Science and Technology, Tosu, Saga 841-0052, Japan. kazufumi-sakai@aist.go.jp
authors.forename: Kazufumi
authors.initials: K
authors.lastname: Sakai
authors.forename: Toshiaki
authors.initials: T
authors.lastname: Koga
authors.forename: Yusuke
authors.initials: Y
authors.lastname: Imai
authors.forename: Shouko
authors.initials: S
authors.lastname: Maehara
authors.forename: Chao-Nan
authors.initials: CN
authors.lastname: Xu
mesh_terms: D000537:Aluminum Oxide / Q000737:chemistry*; D055598:Chemical Phenomena; D002627:Chemistry, Physical; D005063:Europium / Q000737:chemistry*; D049449:Luminescence; D018625:Microscopy, Atomic Force / Q000379:methods; D010316:Particle Size; D012680:Sensitivity and Specificity; D013324:Strontium / Q000737:chemistry*; D013997:Time Factors
chemical_list: D005063:Europium; D000537:Aluminum Oxide; D013324:Strontium