Observation of mechanically induced luminescence from microparticles.
We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.
Sakai
Kazufumi
K
National Institute of Advanced Industrial Science and Technology, Tosu, Saga 841-0052, Japan. kazufumi-sakai@aist.go.jp
Koga
Toshiaki
T
Imai
Yusuke
Y
Maehara
Shouko
S
Xu
Chao-Nan
CN
D000537:Aluminum Oxide / Q000737:chemistry*; D055598:Chemical Phenomena; D002627:Chemistry, Physical; D005063:Europium / Q000737:chemistry*; D049449:Luminescence; D018625:Microscopy, Atomic Force / Q000379:methods; D010316:Particle Size; D012680:Sensitivity and Specificity; D013324:Strontium / Q000737:chemistry*; D013997:Time Factors
D005063:Europium; D000537:Aluminum Oxide; D013324:Strontium