title: Two-dimensional spectral shearing interferometry for few-cycle pulse characterization.
abstract: We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves.
authors.affiliation: Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. birge@mit.edu
authors.forename: Jonathan R
authors.initials: JR
authors.lastname: Birge
authors.forename: Richard
authors.initials: R
authors.lastname: Ell
authors.forename: Franz X
authors.initials: FX
authors.lastname: Kärtner