Two-dimensional spectral shearing interferometry for few-cycle pulse characterization.
We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves.
Birge
Jonathan R
JR
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. birge@mit.edu
Ell
Richard
R
Kärtner
Franz X
FX