title: Extended dynamical HAADF STEM image simulation using the Bloch-wave method.
abstract: An extended method is proposed for the precise simulation of high-angle annular dark-field (HAADF) scanning transmission electron-microscope (STEM) images for materials containing elements with large atomic numbers and for thick specimens. The approach combines a previously reported method utilizing two kinds of optical potential [Watanabe, Yamazaki, Hashimoto & Shiojiri (2001). Phys. Rev. B, 64, 115432] with a representation of a crystal sliced into multiple layers. The validity of the method is demonstrated by simulated images for elements with the diamond structure (Si, Ge and alpha-Sn) and for the perovskite BaTiO3.
authors.affiliation: Department of Physics, Tokyo University of Science, Tokyo, 162-8601, Japan. yamazaki@rs.kagu.tus.ac.jp
authors.forename: Takashi
authors.initials: T
authors.lastname: Yamazaki
authors.forename: Kazuto
authors.initials: K
authors.lastname: Watanabe
authors.forename: Koji
authors.initials: K
authors.lastname: Kuramochi
authors.forename: Iwao
authors.initials: I
authors.lastname: Hashimoto