Extended dynamical HAADF STEM image simulation using the Bloch-wave method.
An extended method is proposed for the precise simulation of high-angle annular dark-field (HAADF) scanning transmission electron-microscope (STEM) images for materials containing elements with large atomic numbers and for thick specimens. The approach combines a previously reported method utilizing two kinds of optical potential [Watanabe, Yamazaki, Hashimoto & Shiojiri (2001). Phys. Rev. B, 64, 115432] with a representation of a crystal sliced into multiple layers. The validity of the method is demonstrated by simulated images for elements with the diamond structure (Si, Ge and alpha-Sn) and for the perovskite BaTiO3.
Yamazaki
Takashi
T
Department of Physics, Tokyo University of Science, Tokyo, 162-8601, Japan. yamazaki@rs.kagu.tus.ac.jp
Watanabe
Kazuto
K
Kuramochi
Koji
K
Hashimoto
Iwao
I