[Study of nanostructures and reflective spectra of porous alumina films].
Several chips of porous alumina films with different nanostructures and scales were prepared by using the method of anodic oxidation. An atomic force microscope (AFM) was employed to image the surfaces of alumina films, and the corresponding reflective spectra of them were acquired with a spectrometer. The experiments show that the alumina films with average pore diameters of 26 and 39 nm feature particular reflective spectra, each consisting of a periodic distribution of peaks and valleys within the wavelength range from 500 nm to 1000 nm. The density or the number of peaks and valleys was determined by the scales of nanostructures. The present paper discussed the relationship between the scale of nanostructures and the distribution of reflective spectra. Some satisfying explanations for them were presented.
Zhang
Dong-xian
DX
State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China.
Zhang
Hai-jun
HJ
Lin
Xiao-feng
XF
He
Yu-Lin
YL