title: Quantitative characterization of the limiting resolution of a microscanning imager.
abstract: A method to determine the limiting resolution of a microscanning imager is proposed. Specifically, both the sample-scene phase effects and aliasing effects due to microscanning are modeled in this method by combining the pixel transfer function and the squeeze modulation transfer function. Further, this model is used to calculate the amount of improvement from typical microscanning modes to the limiting resolution of the imager focusing on various blur factors. Analytical results show that the limiting resolution of the microscanning imager is closely related to microscanning modes. The amount of improvement from different microscanning modes to the limiting resolution is different and is closely associated with the fill factor and the blur factors. The conclusion obtained will be helpful in choosing the optimum microscanning mode according to the fill factor of the detector and system blur factors.
authors.affiliation: School of Technical Physics, Xidian University, Xi'an, Shaanxi, China. wx_rui@sohu.com
authors.forename: Xiao-Rui
authors.initials: XR
authors.lastname: Wang
authors.forename: Jian-Qi
authors.initials: JQ
authors.lastname: Zhang