Inner-valence states of N2+ and the dissociation dynamics studied by threshold photoelectron spectroscopy and configuration interaction calculation.
The N2(+) states lying in the ionization region of 26-45 eV and the dissociation dynamics are investigated by high-resolution threshold photoelectron spectroscopy and threshold photoelectron-photoion coincidence spectroscopy. The threshold photoelectron spectrum exhibits several broad bands as well as sharp peaks. The band features are assigned to the N2(+) states associated with the removal of an inner-valence electron, by a comparison with a configuration interaction calculation. In contrast, most of the sharp peaks on the threshold photoelectron spectrum are allocated to ionic Rydberg states converging to N2(2+). Dissociation products formed from the inner-valence N2(+) states are determined by threshold photoelectron-photoion coincidence spectroscopy. The dissociation dynamics of the inner-valence ionic states is discussed with reference to the potential energy curves calculated.
Aoto
Tomohiro
T
Photon Factory, Institute of Materials Structure Science, Tsukuba, Ibaraki 305-0801, Japan.
Ito
Kenji
K
Hikosaka
Yasumasa
Y
Shibasaki
Akihiro
A
Hirayama
Ryo
R
Yamamono
Norifumi
N
Miyoshi
Eisaku
E