title: [Surface and interface analysis of PTCDA/ITO using X-ray photoelectron spectroscopy (XPS)].
abstract: X-ray photoelectron spectroscopy (XPS) of surface and interface of PTCDA/ITO in PTCDA/p-Si organic-on-inorganic photoelectric detector was investigated. From C1s fine spectrum we found that the binding energy of C atoms in perylene rings was 284.6 eV; and the binding energy of C atoms in acid radical was 288.7 eV; moreover, some C atoms were oxidized by O atoms from ITO. The binding energy of O atoms in C=O bonds and C-O-C bonds was 531.5 and 533.4 eV, respectively. At the interface, the peak of high binding energy in C1s spectrum disappeared, and the main peak shifted toward lower binding energy.
authors.affiliation: School of Physical Science and Technology, Lanzhou University, China.
authors.forename: Gu-ping
authors.initials: GP
authors.lastname: Ou
authors.forename: Zhen
authors.initials: Z
authors.lastname: Song
authors.forename: Wen-ming
authors.initials: WM
authors.lastname: Gui
authors.forename: Fu-jia
authors.initials: FJ
authors.lastname: Zhang