title: Inner-valence states of N2+ and the dissociation dynamics studied by threshold photoelectron spectroscopy and configuration interaction calculation.
abstract: The N2(+) states lying in the ionization region of 26-45 eV and the dissociation dynamics are investigated by high-resolution threshold photoelectron spectroscopy and threshold photoelectron-photoion coincidence spectroscopy. The threshold photoelectron spectrum exhibits several broad bands as well as sharp peaks. The band features are assigned to the N2(+) states associated with the removal of an inner-valence electron, by a comparison with a configuration interaction calculation. In contrast, most of the sharp peaks on the threshold photoelectron spectrum are allocated to ionic Rydberg states converging to N2(2+). Dissociation products formed from the inner-valence N2(+) states are determined by threshold photoelectron-photoion coincidence spectroscopy. The dissociation dynamics of the inner-valence ionic states is discussed with reference to the potential energy curves calculated.
authors.affiliation: Photon Factory, Institute of Materials Structure Science, Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Tomohiro
authors.initials: T
authors.lastname: Aoto
authors.forename: Kenji
authors.initials: K
authors.lastname: Ito
authors.forename: Yasumasa
authors.initials: Y
authors.lastname: Hikosaka
authors.forename: Akihiro
authors.initials: A
authors.lastname: Shibasaki
authors.forename: Ryo
authors.initials: R
authors.lastname: Hirayama
authors.forename: Norifumi
authors.initials: N
authors.lastname: Yamamono
authors.forename: Eisaku
authors.initials: E
authors.lastname: Miyoshi