title: Surface microanalysis with slow electrons.
abstract: Microanalysis on the 10-nm level using imaging, diffraction, and spectroscopy of slow photo-emitted and reflected electrons is discussed. The instrumentation that uses a cathode lens is briefly reviewed, and a number of applications illustrate the power of this microanalysis method.
authors.affiliation: Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA. ernst.bauer@asu.edu
authors.forename: Ernst G
authors.initials: EG
authors.lastname: Bauer