title: Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy.
abstract: A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measurements for the reduction of Ru(NH3)6Cl3 and feedback experiments showed a distinct and reproducible response of the electrode. These experimental results agreed with finite element simulations for the corresponding diffusion process. Sequentially topographical and electrochemical studies of Pt lines deposited onto Si3N4 and spaced 100 nm apart (edge to edge) showed a lateral electrochemical resolution of 10 nm.
authors.affiliation: Institute of Microtechnology, University of Neuchâtel, rue Jaquet-Droz 1, 2001 Neuchâtel, Switzerland.
authors.forename: Maurizio R
authors.initials: MR
authors.lastname: Gullo
authors.forename: Patrick L T M
authors.initials: PL
authors.lastname: Frederix
authors.forename: Terunobu
authors.initials: T
authors.lastname: Akiyama
authors.forename: Andreas
authors.initials: A
authors.lastname: Engel
authors.forename: Nico F
authors.initials: NF
authors.lastname: deRooij
authors.forename: Urs
authors.initials: U
authors.lastname: Staufer