title: Characterizing probe performance in the aberration corrected STEM.
abstract: Sub-Angstrom imaging using the 120 kV IBM STEM is now routine if the probe optics is carefully controlled and fully characterized. However, multislice simulation using at least a frozen phonon approximation is required to understand the Annular Dark Field image contrast. Analysis of silicon dumbbell structures in the [110] and [211] projections illustrate this finding. Using fast image acquisition, atomic movement appears ubiquitous under the electron beam, and may be useful to illuminate atomic level processes.
authors.affiliation: IBM Thomas J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, NY 10598, USA. batson@us.ibm.com
authors.forename: P E
authors.initials: PE
authors.lastname: Batson