General equation for size nanocharacterization of the core-shell nanoparticles by X-ray photoelectron spectroscopy.
Nanocharacterization is essential for nanoengineering of new types of core-shell (c-s) nanoparticles, which can be used to design new devices for photonics, electronics, catalysis, medicine, etc. X-ray photoelectron spectroscopy (XPS) has been widely used to study the elemental composition of the c-s nanoparticles. However, the physical and chemical properties of a c-s nanoparticle dramatically depend on the sizes of its core and shell. We therefore propose a general equation for the XPS intensity of a c-s nanoparticle, which is based on an analytical model. With this equation, XPS can now also be used for nanocharacterization of the core and shell sizes of the c-s nanoparticles (with a diameter smaller than or equal to the XPS probing depth of approximately 10 nm). To validate the new equation with experimental XPS data, we first determine the average shell thickness of a group of c-s nanoparticles by comparing the XPS intensity of reference bare cores to that of the c-s nanoparticles. Then we study the growth kinetics of the cores and shells of another group of c-s nanoparticles where the shells are obtained by oxidation.
Gillet
Jean-Numa
JN
Laser Processing Laboratory, Department of Engineering Physics, Ecole Polytechnique de Montréal, C.P. 6079, succ. Centre-ville, Montréal, Québec H3C 3A7, Canada. jngillet@videotron.ca
Meunier
Michel
M
D036103:Nanotechnology; D013057:Spectrum Analysis / Q000379:methods*; D014965:X-Rays