title: Proton diffusion determination and dual structure model for nickel hydroxide based on potential step measurements on single spherical beads.
abstract: Potential step measurement is carried out on single beads of spherical nickel hydroxide to determine the proton diffusion coefficient (D) and concentration of the effective proton vacancies (C). The semi-infinite diffusion equation for the initial stage and the finite diffusion equation for the long-term of the current response to potential step are used for deducing the D and C values. The diffusion coefficients deduced from short and long-term current responses are in the order of magnitude 10(-7) and 10(-10) cm2 s(-1), respectively. The sum of the effective proton vacancy concentrations associated with the two D values comes out to be equal within experimental error to the effective proton vacancy concentration converted from the released electricity during discharge. A dual structure model is proposed to interpret the above-mentioned findings, featuring densely packed grains within which proton diffusion is slow and an inter-grain matrix where proton diffusion is fast. With this model the huge difference (about 6 orders of magnitude) in D values reported in the literature as well as the controversy of the dependence of diffusion coefficient on the state of charge can be largely rationalized. This dual structure model is supported by SEM and AFM observations.
authors.affiliation: Department of Chemistry, Wuhan University, Wuhan 430072, China.
authors.forename: Liang
authors.initials: L
authors.lastname: Xiao
authors.forename: Jun-tao
authors.initials: JT
authors.lastname: Lu
authors.forename: Pei-fang
authors.initials: PF
authors.lastname: Liu
authors.forename: Lin
authors.initials: L
authors.lastname: Zhuang
authors.forename: Jiawei
authors.initials: J
authors.lastname: Yan
authors.forename: Yonggang
authors.initials: Y
authors.lastname: Hu
authors.forename: Bingwei
authors.initials: B
authors.lastname: Mao
authors.forename: Changjian
authors.initials: C
authors.lastname: Lin