title: Extended focus depth for Fourier domain optical coherence microscopy.
abstract: We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of approximately 1.5 microm along a focal range of 200 microm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 microm in air.
authors.affiliation: Laboratoire d'Optique Biomedicale, Ecole Polytechnique Federale de Lausanne, CH-1015 Lausanne, Switzerland. rainerleitgeb@epfl.ch
authors.forename: R A
authors.initials: RA
authors.lastname: Leitgeb
authors.forename: M
authors.initials: M
authors.lastname: Villiger
authors.forename: A H
authors.initials: AH
authors.lastname: Bachmann
authors.forename: L
authors.initials: L
authors.lastname: Steinmann
authors.forename: T
authors.initials: T
authors.lastname: Lasser
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005583:Fourier Analysis; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000295:instrumentation* / Q000379:methods; D008853:Microscopy / Q000295:instrumentation* / Q000379:methods; D041623:Tomography, Optical Coherence / Q000295:instrumentation* / Q000379:methods