Fourier transform approach for thickness estimation of reflecting interference filters.
An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are proposed and justified by numerical examples.
Verly
Pierre G
PG
Institute for Microstructural Sciences, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada. pierre.verly@nrc-cnrc.gc.ca