title: Preparation of TEM samples of metal-oxide interface by the focused ion beam technique.
abstract: This paper describes a procedure to prepare metal-oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal-oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.
authors.affiliation: Paul Scherrer Institut, Laboratory for Materials Behaviour, 5232 Villigen-PSI Switzerland. sousan.abolhassani@psi.ch
authors.forename: S
authors.initials: S
authors.lastname: Abolhassani
authors.forename: Philippe
authors.initials: P
authors.lastname: Gasser