title: Effects of thermal annealing on the Li(+) intercalation properties of V(2)O(5) x nH(2)O xerogel films.
abstract: V(2)O(5) x nH(2)O xerogel films with n = 1.6, 0.6, and 0.3 have been prepared from the sol-gel route by reacting V(2)O(5) with H(2)O(2) followed by drying under ambient conditions and thermal annealing at 110 and 250 degrees C, respectively. After dehydration, V(2)O(5) crystallizes at 300-330 degrees C, as revealed by thermal gravimetric analysis and X-ray diffraction. Electrochemical characterization demonstrated that V(2)O(5) x 0.3H(2)O film exhibits the best Li(+) intercalation performance, with an initial capacity of 275 mAh/g and a stabilized capacity of 185 mAh/g under a high current density of 100 microA/cm(2) after 50 cycles. Under a low current density of 10 microA/cm(2), the capacity of this film can reach 390 mAh/g. Such an enhanced electrochemical property by thermal treatment is ascribed to the reduced water content, the retained interlayer spacing, and the dominant amorphous phase in the film.
authors.affiliation: Materials Science and Engineering, University of Washington, 302 Roberts Hall, Box 352120, Seattle, Washington 98195, USA.
authors.forename: Ying
authors.initials: Y
authors.lastname: Wang
authors.forename: Huamei
authors.initials: H
authors.lastname: Shang
authors.forename: Tammy
authors.initials: T
authors.lastname: Chou
authors.forename: Guozhong
authors.initials: G
authors.lastname: Cao