title: Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio.
abstract: A new method to extract complex refractive indices of films with biaxial symmetry from polarized transmission and reflection spectra is described. Theoretical analysis demonstrates that the reflectance/transmittance ratio (R/T ratio) of two films of different thicknesses but with the same optical anisotropy is a simple function of the refractive index (n) and extinction coefficient (k). For films with biaxial symmetry, components of n and k on symmetric axes can be extracted from either s- or p-polarized R/T ratios if the film thickness values are known. The R/T ratio method can generate n and k spectra within a particular wavelength range without assuming a specific relationship among n, k, and wavelength, which is an advantage over many currently available techniques. The R/T ratio method is used to extract the anisotropic complex refractive indices of a polyimide film with known uniaxial symmetry. The resultant n and k spectra compare well with simulations based on known n and k values. The accuracy of n and k spectra is affected mostly by data error in reflection and transmission spectra collection, thickness variation across sample films, and error in sample alignment.
authors.affiliation: School of Chemical and Biomolecular Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0100, USA.
authors.forename: Jie
authors.initials: J
authors.lastname: Diao
authors.forename: Dennis W
authors.initials: DW
authors.lastname: Hess