title: Focused ion beam manipulation and ultramicroscopy of unprepared cells.
abstract: The focused ion beam (FIB) technique of nanomachining combined with simultaneous scanning electron microscopy (SEM) was used for submicron manipulation and imaging of unprepared (fresh) cells to demonstrate the potentiality of the FIB/SEM technique for ultramicroscopic studies. Sectioning at the nanoscale level was successfully performed by means of ion beam-driven milling operations that reveal the ultrastructure of fresh yeast cells. The FIB/SEM has many advantages over other ultramicroscopy techniques already applied for unprepared/fresh biological samples.
authors.affiliation: Department of Material Sciences, University of Milano-Bicocca, Milan, Italy. marziale.milani@mater.unimib.it
authors.forename: Marziale
authors.initials: M
authors.lastname: Milani
authors.forename: Damjana
authors.initials: D
authors.lastname: Drobne
mesh_terms: D000818:Animals; D003445:Crustacea; D006801:Humans; D033321:Isopoda / Q000648:ultrastructure; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D036103:Nanotechnology / Q000379:methods; D009865:Oocytes / Q000648:ultrastructure*; D012441:Saccharomyces cerevisiae / Q000648:ultrastructure*; D013048:Specimen Handling / Q000379:methods