Preparation of TEM samples of metal-oxide interface by the focused ion beam technique.
This paper describes a procedure to prepare metal-oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal-oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.
Abolhassani
S
S
Paul Scherrer Institut, Laboratory for Materials Behaviour, 5232 Villigen-PSI Switzerland. sousan.abolhassani@psi.ch
Gasser
Philippe
P