Measurement of the terahertz-induced phase shift in electro-optic sampling for an arbitrary biasing phase.
We present a simple method to correct for nonlinearities in the detection of terahertz (THz) transients by electro-optic sampling. The THz-induced phase shift of the optical probe beam is calibrated with an additional biasing phase from a variable wave plate. All the parameters that are needed for the determination of this phase shift can be directly measured, which makes the method insensitive to errors resulting from residual birefringences of the electro-optic material or imperfections of the wave plate. We show that the THz-induced phase shift is correctly revealed for a wide range of the biasing phase.
Schneider
Arno
A
Nonlinear Optics Laboratory, Institute of Quantum Electronics, ETH Zurich, Switzerland. arno@phys.ethz.ch
Günter
Peter
P