title: mu-GISAXS experiment and simulation of a highly ordered model monolayer of PMMA-beads.
abstract: Uniform sized PMMA-beads were deposited as a monolayer on silicon substrates using dip-coating techniques. High-resolution grazing incidence X-ray small angle scattering experiments were performed using a micrometer sized beam (mu-GISAXS) to determine the structure of a highly ordered monolayer with two-dimensional hexagonal arrays. A clear and strong interference pattern coming from the reflection and refraction effects of particles on flat surfaces with small uncorrelated roughnesses is shown. The quantitative analysis and simulations of the X-ray scattering pattern have been performed, and a detailed explanation of the analysis is reported. The results were directly compared and verified with atomic force microscopy (AFM) measurements and their resulting FFT spectra.
authors.affiliation: Institut für Physikalische Chemie, Universität Hamburg, Grindelallee 117, D-20146 Hamburg, Germany. andreas.froemsdorf.@chemie.uni-hamburg.de
authors.forename: Andreas
authors.initials: A
authors.lastname: Frömsdorf
authors.forename: Richard
authors.initials: R
authors.lastname: Capek
authors.forename: Stephan Volkher
authors.initials: SV
authors.lastname: Roth