title: A flexible instrument control and image acquisition system for a scanning electron microscope.
abstract: We have developed an instrument control and image acquisition system for use with scanning electron microscopes. By making the system flexible over a wide range of operating voltages, scan generation and image acquisition modes can be easily accommodated to a wide range of instruments. We show the implementation of this system for use with a custom-built low-voltage scanning electron microscope. We then explore the simple modifications that are required for control of two instruments intended for use as free electron lasers.
authors.affiliation: Enrico Fermi Institute, University of Chicago, 5640 S. Ellis Ave., Chicago Il 60637, USA. bud@midway.uchicago.edu
authors.forename: O H
authors.initials: OH
authors.lastname: Kapp
authors.forename: D R
authors.initials: DR
authors.lastname: Smith
authors.forename: G
authors.initials: G
authors.lastname: Jendraszkiewicz
authors.forename: I
authors.initials: I
authors.lastname: Gorodezky
authors.forename: Kwang-Je
authors.initials: KJ
authors.lastname: Kim
authors.forename: A V
authors.initials: AV
authors.lastname: Crewe