title: Oxygen-deficient line defects in an ultrathin aluminum oxide film.
abstract: A model for the straight antiphase domain boundary of the ultrathin aluminum oxide film on the NiAl(110) substrate is derived from scanning tunneling microscopy measurements and density-functional theory calculations. Although the local bonding environment of the perfect film is maintained, the structure is oxygen deficient and possesses a favorable adsorption site. The domain boundary exhibits a downwards band bending and three characteristic unoccupied electronic states, in excellent agreement with scanning tunneling spectroscopy measurements.
authors.affiliation: Institut für Allgemeine Physik, Technische Universität Wien, A 1040 Wien, Austria.
authors.forename: M
authors.initials: M
authors.lastname: Schmid
authors.forename: M
authors.initials: M
authors.lastname: Shishkin
authors.forename: G
authors.initials: G
authors.lastname: Kresse
authors.forename: E
authors.initials: E
authors.lastname: Napetschnig
authors.forename: P
authors.initials: P
authors.lastname: Varga
authors.forename: M
authors.initials: M
authors.lastname: Kulawik
authors.forename: N
authors.initials: N
authors.lastname: Nilius
authors.forename: H-P
authors.initials: HP
authors.lastname: Rust
authors.forename: H-J
authors.initials: HJ
authors.lastname: Freund