title: Dose dependences of radiation induced yield in mixed radiation fields.
abstract: A theoretical model that describes dose dependences of trap filling (radiation yield) in mixed radiation fields consisting of two components is proposed. The model consists of one type of electron traps and one type of hole traps and assumes as an initial step the creation of two types of tracks, each represented by some volume with a uniform electron-hole pair density, different for each track. The relaxation process that follows comprises interband recombination, trapping of electrons and holes, and recombination of electrons with trapped holes and of holes with trapped electrons. These processes result in filled traps in amounts depending on the absorbed dose in the track and the number and types of tracks created in a given region of irradiated matter. The summation over the matter with areas of different degrees of overlapping (assuming poisson distribution of the created tracks), gives expressions for the dependences of trap filling as a function of doses for separated and simultaneous irradiation. It is shown that the key parameters determining the behaviour of the dose dependences are the ratios between the doses in the separated tracks and the average doses delivered on the irradiated matter by the separated components of the mixed field. If the ratios of the average dose to the track dose are low, the dose dependences will be linear. In the opposite limiting case the dose dependencies go to saturation. The linear and additive approximations of dose dependences in a mixed field are valid at low doses only.
authors.affiliation: Centro de Investigación en Física, Universidad de Sonora, Apdo. Postal 5-088. Hermosillo, Sonora 83000, México. chernov@cajeme.cifus.uson.mx
authors.forename: V
authors.initials: V
authors.lastname: Chernov
authors.forename: T M
authors.initials: TM
authors.lastname: Piters
authors.forename: M
authors.initials: M
authors.lastname: Barboza-Flores
mesh_terms: D003198:Computer Simulation; D004307:Dose-Response Relationship, Radiation; D004574:Electromagnetic Fields; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008962:Models, Theoretical; D011829:Radiation Dosage; D011874:Radiometry / Q000295:instrumentation / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity