title: Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis.
abstract: Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initial estimates of the dielectric constants and thicknesses of the metal film and a nanolayer on the sensing surface of a SPR sensor. A multiexperiment data analysis approach based on a two-solvent SPR method is then employed to improve the initial estimates by suppressing the noise in the measurement data. The proposed two-stage approach is employed to determine the dielectric constant and thickness of a molecular imprinting polymer nanolayer. It is found that the results are in good agreement with those obtained with an ellipsometer and a high-resolution scanning electron microscope.
authors.affiliation: Department of Mechanical Engineering, National Central University, Taiwan.
authors.forename: Jin-Jung
authors.initials: JJ
authors.lastname: Chyou
authors.forename: Chih-Sheng
authors.initials: CS
authors.lastname: Chu
authors.forename: Fan-Ching
authors.initials: FC
authors.lastname: Chien
authors.forename: Chun-Yu
authors.initials: CY
authors.lastname: Lin
authors.forename: Tse-Liang
authors.initials: TL
authors.lastname: Yeh
authors.forename: Roy Chaoming
authors.initials: RC
authors.lastname: Hsu
authors.forename: Shean-Jen
authors.initials: SJ
authors.lastname: Chen