title: Grazing angle mirror-backed reflection (GMBR) for infrared analysis of monolayers on silicon.
abstract: An easy handling infrared measurement, grazing angle mirror-backed reflection (GMBR), has been established to analyze the silicon-based organic monolayer. Theoretical prediction gave the optimal configuration with p-polarized irradiation near a grazing angle 78.1 degrees of incidence. Experimental measurement of hydrogen-terminated, undecylenic acid (UA) and N-hydroxysuccinimide (NHS) functionalized silicon (111) surfaces showed good signal peaks and reproducibility.
authors.forename: Hong-Bo
authors.initials: HB
authors.lastname: Liu
authors.forename: Shou-Jun
authors.initials: SJ
authors.lastname: Xiao
authors.forename: Ya-Qing
authors.initials: YQ
authors.lastname: Chen
authors.forename: Jie
authors.initials: J
authors.lastname: Chao
authors.forename: Jing
authors.initials: J
authors.lastname: Wang
authors.forename: Yue
authors.initials: Y
authors.lastname: Wang
authors.forename: Yi
authors.initials: Y
authors.lastname: Pan
authors.forename: Xiao-Zeng
authors.initials: XZ
authors.lastname: You
authors.forename: Zhong-Ze
authors.initials: ZZ
authors.lastname: Gu