title: Near-field microscopy through a SiC superlens.
abstract: The wave nature of light limits the spatial resolution in classical microscopy to about half of the illumination wavelength. Recently, a new approach capable of achieving subwavelength spatial resolution, called superlensing, was invented, challenging the already established method of scanning near-field optical microscopy (SNOM). We combine the advantages of both techniques and demonstrate a novel imaging system where the objects no longer need to be in close proximity to a near-field probe, allowing for optical near-field microscopy of subsurface objects at sub-wavelength-scale lateral resolution.
authors.affiliation: Nano-Photonics Group, Max-Planck-Institut für Biochemie, Am Klopferspitz 18, D-82152 Martinsried, Germany.
authors.forename: Thomas
authors.initials: T
authors.lastname: Taubner
authors.forename: Dmitriy
authors.initials: D
authors.lastname: Korobkin
authors.forename: Yaroslav
authors.initials: Y
authors.lastname: Urzhumov
authors.forename: Gennady
authors.initials: G
authors.lastname: Shvets
authors.forename: Rainer
authors.initials: R
authors.lastname: Hillenbrand