title: 4Pi microscopy deconvolution with a variable point-spread function.
abstract: To remove the axial sidelobes from 4Pi images, deconvolution forms an integral part of 4Pi microscopy. As a result of its high axial resolution, the 4Pi point spread function (PSF) is particularly susceptible to imperfect optical conditions within the sample. This is typically observed as a shift in the position of the maxima under the PSF envelope. A significantly varying phase shift renders deconvolution procedures based on a spatially invariant PSF essentially useless. We present a technique for computing the forward transformation in the case of a varying phase at a computational expense of the same order of magnitude as that of the shift invariant case, a method for the estimation of PSF phase from an acquired image, and a deconvolution procedure built on these techniques.
authors.affiliation: Kirchhoff Institut für Physik, Universität Heidelberg, Germany. david.baddeley@kip.uni-heidelberg.de
authors.forename: David
authors.initials: D
authors.lastname: Baddeley
authors.forename: Christian
authors.initials: C
authors.lastname: Carl
authors.forename: Christoph
authors.initials: C
authors.lastname: Cremer