title: Power dependence of the frequency bias caused by spurious components in the microwave spectrum in atomic fountains.
abstract: The presence of spurious spectral components in the microwave excitation may induce frequency shifts in an atomic fountain frequency standard. We discuss how such shifts behave as a function of power variations of the excitation carrier and in the spur-to-carrier ratio. The discussion here is limited to the case of single-sideband spurs, which are generally much more troublesome due to their ability to cause frequency shifts. We find an extremely rich and unintuitive behavior of these frequency shifts. We also discuss how pulsed operation, typical of today's fountain frequency standards, relates to frequency shifts caused by spurs in the microwave spectrum. The conclusion of these investigations is that it is, at best, difficult to use elevated power microwaves in fountain frequency standards to test for the presence of spurs in the microwave spectrum.
authors.affiliation: IEN-G. Ferraris, 10135 Torino, Italy.
authors.forename: Filippo
authors.initials: F
authors.lastname: Levi
authors.forename: Jon H
authors.initials: JH
authors.lastname: Shirley
authors.forename: Thomas P
authors.initials: TP
authors.lastname: Heavner
authors.forename: Dai-Hyuk
authors.initials: DH
authors.lastname: Yu
authors.forename: Steven R
authors.initials: SR
authors.lastname: Jefferts